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Simultaneous ESPI Measurements Using Multiple Wavelengths and a Color Camera

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Abstract

ESPI is typically done using a single monochromatic light source with a monochrome camera. This arrangement enables full-field measurements of a single deformation quantity according to the particular arrangement of the optical system. If a further deformation quantity is to be measured, then the associated optical arrangement must be used sequentially. Here, an alternative approach is described where multiple interferometric measurements are simultaneously made using a color camera imaging monochromatic light sources of different wavelengths. The Red-Green-Blue (RGB) sensors of a conventional Bayer type camera can be read separately, thereby providing three independent color signals and independent ESPI phase maps. An example case is demonstrated here where two Michelson interferometers are combined to form a shearography camera with surface slope sensitivity in two perpendicular directions. By the use of two colors, both surface slopes can be measured simultaneously. The availability of the two surface slopes gives the opportunity for the data to be integrated numerically to give the surface displacement shape. This application is of significant practical interest because the surface displacement measurement can be made under field conditions by taking advantage of the well-known stability of shearography measurements.

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References

  1. Leendertz JA (1970) Interferometric displacement measurement on scattering surfaces utilizing speckle effect. J Phys E Sci Instrum 3(3):214–218

    Article  Google Scholar 

  2. Butters JN, Leendertz JA (1971) Speckle pattern and holographic techniques in engineering metrology. Opt Laser Technol 3(1):26–30

    Article  Google Scholar 

  3. Steinchen W, Yang L (2003) Digital shearography: theory and application of digital speckle pattern shearing interferometry. SPIE Press, Bellingham, WA, p 310

    Google Scholar 

  4. Hack E, Riner M (2001) 3D ESPI and 3D shearography measurements applied to NDT and FEM analysis validation for industrial quality control. Proc SPIE 4398:155–167

    Article  Google Scholar 

  5. Burnett M, Bryanston-Cross PJ (1996) Measurements of transonic shock structures using shearography. Proc SPIE 2861:124–135

    Article  Google Scholar 

  6. Hack E, Kaestle RP (1999) Multi-wavelengths shearography for optical whole-field strain measurements. In: Colloque Nouveaux Moyens Optiques Pour L’Industrie II, Mittelwihr/Colmar (F), Proceedings, 17–19 November 1999, pp 31–36

    Google Scholar 

  7. Bayer BE (1976) Color imaging array. US patent 3,971,065, US Patent and Trademarks Office, Washington DC, 1976

    Google Scholar 

  8. Georgas P, Schajer GS (2012) Simultaneous measurement of full-field vibration modes using ESPI. Exp Mech 53(8):1461–1466

    Article  Google Scholar 

  9. Rastogi P, Hack E (2012) Optical methods for solid mechanics: a full-field approach. Wiley, Chichester

    Google Scholar 

  10. Yang LX, Steinchen W, Schuth M, Kupfer G (1995) Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry. J Int Meas Confed 16(3):149–160

    Article  Google Scholar 

  11. Sirohi RS, Chau FS (1999) Optical methods of measurement: wholefield techniques. Dekker, New York

    Google Scholar 

  12. An Y, Schajer GS (2011) Pixel quality evaluation and correction procedures in ESPI. Exp Tech 35(5):23–29

    Article  Google Scholar 

  13. Giglia DC, Pritt MD (1998) Two-dimensional phase unwrapping: theory, algorithms, and software. Wiley-Interscience, New York

    Google Scholar 

  14. Pomeroy RJ (1970) The effect of anticlastic bending on the curvature of beams. Int J Solids Struct 6(2):277–285

    Article  MATH  Google Scholar 

  15. Schnars U, Jüptner W (1992) Messung von Absolutverformungen mit Methoden der holografischen Interferometrie und der Elektronischen Specklemuster-Interferometrie. Laser und Optoelektronik 24(1):59–63

    Google Scholar 

  16. Marwitz H (1990) Holografische Konturgenerierung, Chapter 18 in Praxis der Holografie—Grundlagen, Standard- und Spezialverfahren, Marwitz, H (ed.) Expert Verlag, Stuttgart

    Google Scholar 

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Acknowledgments

The authors sincerely thank the Natural Sciences and Engineering Research Council of Canada (NSERC), American Stress Technologies, Inc., Pittsburgh, PA, and the Institute for Computing, Information and Cognitive Systems (ICICS), Vancouver, Canada, for financially supporting this research.

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Correspondence to Gary S. Schajer .

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© 2015 The Society for Experimental Mechanics, Inc.

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Richoz, G., Schajer, G.S. (2015). Simultaneous ESPI Measurements Using Multiple Wavelengths and a Color Camera. In: Jin, H., Sciammarella, C., Yoshida, S., Lamberti, L. (eds) Advancement of Optical Methods in Experimental Mechanics, Volume 3. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-06986-9_41

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  • DOI: https://doi.org/10.1007/978-3-319-06986-9_41

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-06985-2

  • Online ISBN: 978-3-319-06986-9

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