Basics of Growth and Structural Characterization

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 197)


In this chapter we review some growth methods like crystallization or epitaxy and give some elements relative to structural characterization methods.


Buffer Layer Reflection High Energy Electron Diffraction Reflection High Energy Electron Diffraction Pattern Epitaxial Lateral Overgrowth Molecular Beam Epitaxy System 
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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Institut de Physique de MontpellierUniversity of Montpellier 2Montpellier Cedex 05France

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