Part of the Embedded Systems book series (EMSY)


We start this chapter in Sect. 1.2 by reviewing the trends, challenges, and methodologies used in the implementation, verification, and validation of SOCs. We describe a generic and commonly-used post-silicon debug process in Sect. 1.3, which helps debug engineers with the localization of the root cause of problems that occur post-silicon. In Sect. 1.4, we show however that this generic process has requirements that cannot easily be met post-silicon. We outline our proposed solution and the organization of this book in Sect. 1.5. In Sect. 1.6 we provide an overview of the contributions of this book with respect to the state of the art in post-silicon debug. We conclude this chapter with a summary in Sect. 1.7.


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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.NXP SemiconductorsEindhovenThe Netherlands
  2. 2.Faculty of Electrical EngineeringEindhoven University of TechnologyEindhovenThe Netherlands

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