Abstract
Magnetic imaging with polarized soft x-rays offers several advantages compared to other techniques, which are available to visualize magnetic structures and magnetic behavior on microscopic levels. The ultimate spatial resolution for soft x-ray techniques, i.e. the diffraction limit set by the wavelength, will be in the few nm regime. The temporal resolution, given by the length of a single x-ray pulse is at 3rd generation synchrotron sources in the sub 100 ps regime, but should reach out into the fs regime at next generation x-ray sources, where single shot imaging should become feasible due to a sufficiently large number of photons per single x-ray pulse. The interaction of polarized soft x-rays with magnetic (ferromagnetic and antiferromagnetic) materials exhibits for element specific photon energies, which correspond to inner core electron binding energies significant magnetic cross sections. These magnetic dichroism effects serve as magnetic contrast mechanism for imaging and give quantitative information about magnetic ground state properties, such as magnetic spin and orbital moments. A full 3 dimensional information, specifically access to magnetic structures at interfaces can be obtained by imaging under certain geometries, as well as from computational magnetic tomography of 2 dimensional projection images.
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References
J. Stöhr and H.C. Siegmann, Magnetism: from Fundamentals to Nanoscale Dynamics (Springer Verlag, Berlin Heidelberg, 2006)
A. Hubert and R. Sch¨afer, Magnetic Domains (Springer, Berlin, 1998)
J. Kerr, Phil. Mag. 3,321–343 (1877)
M. Faraday, Phil. Trans. Royal. Soc. (London) 136, 1–20 (1846)
H.A. Lorentz, Thèorie des phènomènes magneto-optiques rècemment dècouverts, Rapport prèsentès aux Congrès International de Physique, Paris 3, 1 (1900)
F. Schmidt, W. Rave, and A. Hubert, IEEE Trans. Mag. 21, 1596 (1985)
W.K. Hiebert, A. Stankiewicz, and M.R. Freeman, Phys. Rev. B 79, 1134 (1997)
J.L Erskine and E.A Stern, Phys. Rev. B 12, 5016–5024 (1975)
C. T. Chen, F. Sette, Y. Ma, and S. Modesti, Phys. Rev. B 42, 7262–7265 (1990)
P. Carra, B.T. Thole, M. Altarelli, and X. Wang, Phys. Rev. Lett. 70, 694 (1993)
B.T. Thole, P. Carra, F. Sette, and G. van der Laan, Phys. Rev. Lett. 68, 1943–1946 (1992)
J. Stoehr, Y. Wu, B.D. Hermsmeier, M.G. Samant, G. Harp, S. Koranda, D. Dunham, and B.P. Tonner, Science 259, 658 (1993)
P. Fischer, G. Schütz, G. Schmahl P. Guttmann and D. Raasch, Z.f. Physik B 101, 313–316 (1996)
W.C. Röntgen, über eine neue art von strahlen, Sitzungsberichte der Physikalisch- Medizinischen Gesellschaft zu W¨urzburg, p. 132 (1895)
B. Niemann, D. Rudolph, and G. Schmahl, Applied Optics 15, 1883 (1976)
D.T. Attwood, Soft x-rays and Extreme Ultraviolet Radiation (Cambridge University Press, 1999)
F. Macia, P. Warnicke, D. Bedau, M.-Y. Im, P. Fischer, D. A. Arena, and A. D. Kent, J. Magn. Magn. Mat. 324, 3629–3632 (2012)
M.-Y. Im, P. Fischer, T. Eim¨uller, G. Denbeaux, and S.-C. Shin, Appl. Phys. Lett. 83, 4589–4591 (2003)
J.R. Groves, R.F. DePaula, L. Stan, R.H. Hammond, and B.M. Clemens, IEEE Transactions on Applied Superconductivity 19, 3311 (2009)
C. Bordel, J. Juraszek, D. Cooke, C. Baldasseroni, S. Mankovsky, J. Minar, H. Ebert, S. Moyerman, E. Fullerton, and F. Hellman, Phys. Rev. Lett. 109, 117201 (2012)
B. Kaulich, D. Bacescu, D. Cocco, J. Susini, C. David C, E. DiFabrizio, S. Cabrini, G. Morrison, J. Thieme J, and M. Kiskinova, J. Phys. IV 104, 103–107 (2003)
P. Guttmann, C. Bittencourt, S. Rehbein, P. Umek, Xiaoxing Ke, G. Van Tendeloo, C.P. Ewels, and G.Schneider, Nature Photon. 6,25–29 (2012)
I. Schmid, J. Raabe, C. Quitmann, S. Vranjkovic, H.J. Hug, and R.H. Fink, Journal of Physics: Conference Series 1 86, 012015 (2009)
P. Thibault, M. Dierolf, A. Menzel, O. Bunk, Ch. David, and F. Pfeiffer, Science 321, 379 (2008)
S. Eisebitt, J. Lüning, W.F. Schlotter, M. Lörgen, O. Hellwig, W. Eberhardt, and J. Stöhr, Nature 432, 885–888 (2004)
T. Hauet, C. M. Guenther, B. Pfau, M. E. Schabes, J. U. Thiele, R. L. Rick, P. Fischer, S. Eisebitt, and O. Hellwig, Phys. Rev. B 77, 184421 (2008)
C. Tieg, R. Frömter, D. Stickler, S. Hankemeier, A. Kobs, S. Streit-Nierobisch, C. Gutt, G. Grübel, and H. P. Oepen, Optics Express 18, 27251 (2010)
D. Gabor, Nature 161, 777–785 (1948)
A. Tripathi, J. Mohanty, S. H. Dietze, O. G. Shpyrko, E. Shipton, E. E. Fullerton, S. S. Kimb, and I. McNulty, PNAS 108, 13393 (2011)
W. Hoppe R. Hegerl, Ber. Bunsenges. Phys. Chem. 74, 1148 (1970)
K. Giewekemeyer, M. Beckers, T. Gorniak, M. Grunze, T. Salditt, and A. Rosenhahn, Optics Express 19, 1037 (2011)
Martin Dierolf, Andreas Menzel, Pierre Thibault, Philipp Schneider, Cameron M. Kewish, Roger Wepf, Oliver Bunk, and Franz Pfeiffer, Nature 467, 436–439 (2010)
Roland Wiesendanger, Rev. Mod. Phys. 81, 1495–1550 (2009)
W. Chao, B. H. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, Nature 435, 1210 (2005)
E. Anderson and W. Chao, private communication.
J. Vila-Comamala, K. Jefimovs, J. Raabe, T. Pilvi, R. H. Fink, M. Senoner, A. Maaßdorf, M. Ritala, and C. David, Ultramicroscopy 109, 1360-1364 (2009)
P. Guttmann, S. Werner, G. Schneider, S. Rehbein, S. Heim, Phys. Rev. Lett. 103, 110801 (2009)
T. Shinjo, T. Okuno, R. Hassdorf, K. Shigeto, and T. Ono, Science 289, 930 (2000)
A.Wachowiak, J.Wiebe, M. Bode, O. Pietzsch, M. Morgenstern, and R.Wiesendanger, Science 298, 577 (2002)
J. Miltat and A. Thiaville, Science 298, 555 (2002)
C. Phatak, M. Tanase, A.K. Petford-Long, and M. DeGraef, Ultramicroscopy 109, 264 (2009)
J. Raabe, R. Pulwey, R. Sattler, T. Schweinbock, J. Zweck, and D.Weiss, J. Appl. Phys. 88, 4437–4439 (2000)
J.K. Ha, R. Hertel, and J. Kirschner, Phys. Rev. B 67, 224432 (2003)
S.B. Choe, Y. Acremann, A. Scholl, A. Bauer, A. Doran, J. St¨ohr, and H. A. Padmore, Science 304, 420 (2004)
J. Raabe, C. Quitmann, C. H. Back, F. Nolting, S. Johnson, and C. Buehler, Phys. Rev. Lett. 94, 217204 (2005)
K. Buchanan, P.E. Roy, M. Grimsditch, F.Y. Fradin, K.Yu. Guslienko, S.D. Bader, and V. Novosad, Nature Phys. 1, 172 (2005)
S. Kasai, Y. Nakatani, K.. Kobayashi, H. Kohno, and T. Ono, Phys. Rev. Lett. 97, 107204 (2006)
B. Van Waeyenberge, A. Puzic, H. Stoll, K. W. Chou, T. Tyliszczak, R. Hertel, M. F¨ahnle, H. Br¨uckl, K. Rott, G. Reiss, I. Neudecker, D. Weiss, C. H. Back, and G. Sch¨utz, Nature 444, 461 (2006)
K. Yamada, S. Kasai, Y. Nakatani, K. Kobayashi, H. Kohno, A. Thiaville, and T. Ono, Nature Mater. 6, 270 (2007)
P. Fischer, M.-Y. Im, S. Kasai K. Yamada, T. Ono, A. Thiaville, Phys. Rev. B 83, 212402 (2011)
P. Fischer, M.-Y. Im, C. Baldasseroni, C. Bordel, F. Hellman, J.- S. Lee, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. (2013), http://dx.doi.org/10.1016/j.elspec.2013.03.012
P. Fischer, T. Eimuller, G. Schutz, M. Kohler, G. Bayreuther, G. Denbeaux, and D. Attwood, J. Appl. Phys. 89, 7159–7161 (2001)
M.-Y. Im, P. Fischer, Y. Keisuke, T. Sato, S. Kasai, Y. Nakatani, and T. Ono, Nature Comm. 3,983 (2012)
S.-H. Chung, D.T. Pierce, and J. Unguris, Ultramicroscopy 110, 177–181 (2010)
S. Kasai, P. Fischer, M-Y. Im, K. Yamada, Y. Nakatani, K. Kobayashi, H. Kohno, and T. Ono, Phys. Rev. Lett. 101, 237203 (2008)
N. Ohshima K. Nakano and, D. Chiba and, S. Kasai, T. Sato, Y. Nakatani, K. Sekiguchi, K. Kobayashi,, and T. Ono, Appl. Phys. Lett. 99, 262505 (2011)
B. Pigeau, G. de Loubens, O. Klein, A. Riegler, F. Lochner, G. Schmidt, L. W. Molenkamp, V. S. Tiberkevich, and A. N. Slavin, Appl. Phys. Lett. 96, 132506 (2010)
A. Drews, B. Krüger, G. Meier, S. Bohlens, L. Bocklage, T. Matsuyama, and M. Bolte, Appl. Phys. Lett. 94, 062504 (2009)
S.K. Kim, K.S. Lee, Y.S. Yu, and Y.S. Choi, Appl. Phys. Lett. 92, 022509 (2008)
S. Barman, A. Barman, and Y. Otani, J. Phys. D: Appl. Physics 43, 335001 (2010)
Y.S. Yu, H. Jung, K.S. Lee, P. Fischer, and S.K. Kim, Appl. Phys. Lett. 98, 052507 (2011)
K. Yu. Guslienko, B.A. Ivanov, V. Novosad, Y. Otani, H. Shima, and K. Fukamichi, J. Appl. Phys. 91, 8037 (2002)
Y.S. Choi, J.Y. Lee, M.W. Yoo, K.S. Lee, K.Y. Guslienko, and S.K. Kim, Phys. Rev. B 80, 012402 (2009)
K.Yu. Guslienko and V. Novosad, J. Appl. Phys. 96, 4451 (2004)
S.K. Kim, Y.S. Choi, K.S. Lee, K.Y. Guslienko, and D.E. Jeong, Appl. Phys. Lett. 91, 082506 (2007)
S. Gliga, R. Hertel, and C. M. Schneider, J. Appl. Phys.103, 07B115 (2008)
M.W. Yoo, K.S. Lee, D.E. Jeong, and S.K. Kim, Phys. Rev. B 82, 174437 (2010)
D.J. Keavney, X.M. Cheng, and K.S. Buchanan, Appl. Phys. Lett. 94, 172506 (2009)
Ki-Suk Lee, SangKook Choi, and Sang-Koog Kim, Appl. Phys. Lett. 87, 192502 (2005)
M. Fähnle R. Hertel, S. Gliga and C.M. Schneider, Phys. Rev. Lett. 98, 117201 (2007)
B. Van Waeyenberge, A. Puzic, H. Stoll, K. W. Chou, T. Tyliszczak, R. Hertel, M. Fähnle, H. Brückl, K. Rott, G. Reiss, I. Neudecker, D. Weiss, C. H. Back, and G. Schütz, Nature 444, 461 (2006)
H. Jung, K.-S. Lee, D.-E. Jeong, Y.-S. Choi, Y.-S. Yu, D.-S. Han, A. Vogel, L. Bocklage, G. Meier, M.-Y. Im, P. Fischer, and S.-K. Kim, NPG - Scientific Reports 1, 59 (2011)
J. Hemminger : From quanta to the continuum : Opportinities For Mesoscale Science, A Report from the Basic Energy Sciences, University of California, Irvine, U.S. Department of Energy September 2012, Prepared by the BESAC Subcommittee on Mesoscale Science. http://science.energy.gov//media/bes/pdf/reports/files/OFMS rpt.pdf (2012). Accessed 08 Apr 2013
C.A. Larabell and K.A. Nugent, Curr Opinion in Struct. Biology 20, 623 (2010)
D. Rüffer, R. Huber, P. Berberich, S. Albert, E. Russo-Averchi, M. Heiss, J. Arbiol, A. Fontcuberta i Morral, and D. Grundler, Nanoscale 4, 4989–4995 (2012)
A.X. Gray, F. Kronast, C. Papp, S.-H. Yang, S. Cramm, I. Krug, F. Salmassi, E. Gullikson, D. Hilken, E. Anderson, P. Fischer, C.M. Schneider, and C.S. Fadley, Appl. Phys. Lett. 97, 062503 (2010)
G. Denbeaux, P. Fischer, F. Salmassi, K. Dunn, and J. Evertsen, In Proc. 8th Int. Conf. x-ray Microscopy, eds. S. Aoki, Y. Kagoshima and Y. Suzuki (IPAP Conf. Series 7, 2006) pp.375–386
Parkinson DY, Knoechel C, Yang C, Larabell CA, and Le Gros MA, J. Struct. Biol. 177, 259–266 (2012)
Acknowledgments
The author would like to thank all his colleagues, who contributed to the work presented here, in particular M.-Y. Im, W. Chao, and E.H. Anderson (CXRO), L. Bocklage, and G. Meier (U Hamburg), K. Yamada, K. Kobayashi, T. Ono (U Kyoto), T. Sato, Y. Nakatani (U Chofu), H. Kohno (U Osaka), A. Thiaville (U Paris-Sud) S. Kasai (NIMS Tsukuba), S.-K. Kim, H. Jung, D.-E. Jeong, Y.-S. Choi, Y.-S. Yu, D.S. Han (SNU, Seoul), K.-S. Lee (UNIST), C.S. Fadley, A. Gray, J. Kortright, and F. Hellman (MSD LBNL) and the staff of the ALS and CXRO for excellent support. This work was supported by the Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy under Contract No. DE-AC02-05- CH11231.
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Fischer, P. (2013). Magnetic Imaging with Polarized Soft X-rays. In: Beaurepaire, E., Bulou, H., Joly, L., Scheurer, F. (eds) Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources. Springer Proceedings in Physics, vol 151. Springer, Cham. https://doi.org/10.1007/978-3-319-03032-6_5
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