Skip to main content

Large Signal Physical Operation of a III–V Nitride Based Double Velocity Transit Time Device: A Potential Source For THz Imaging

  • Conference paper
  • 173 Accesses

Part of the book series: Environmental Science and Engineering ((ENVENG))

Abstract

Performance of GaN/AlGaN based Double Velocity Avalanche Transit Time device is proposed in this paper, for the first time, for useful application in THz-imaging. The device is designed and analyzed by developing a generalized non-linear large-signal simulator that includes effects of elevated temperature, phonon-bottle-necking, scattering limited mobility-velocity and parasitic resistance. The simulation reveals that the proposed device is capable of generating a considerable pulsed power ~8 × 1010 W/m2 with an efficiency of 8 % at 1.4 THz under 50 % large signal modulation. Dc characterization of the fabricated diodes is in agreement with simulation results.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   259.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD   329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. S.C.Binari, “GaN electronic devices for future systems” MTT-S Conf. 1999, pp-1081-1084 (1999).

    Google Scholar 

  2. Electronic Archive: New Semiconductor Materials, Characteristics and Properties (Online) www.ioffe.ru/SVA/NSM/Semicond/GaN.

  3. K. Kunihiro, K. Kasahara, Y. Takahashi and Y. Ohno,“Experimental evaluation of impact ionization coefficients in GaN”, IEEE Electron Device Lett, vol 20, pp. 608-610, December (1999).

    Article  Google Scholar 

  4. M. Mukherjee, “High-Power Hexagonal SiC Device: A Large-Signal High-Frequency Analysis”, Physics and Technology of Silicon Carbide, INTECH, ISBN 978-953-51-0917-4, DOI: 10.5772/52982, Chapter 14, p. 337, (2012).

    Chapter  Google Scholar 

  5. C. F. Chu, C.C. Yu, Y.K. Wang, J.Y. Tsai, F.I. Lai and S.C. Wang, “Low-resistance ohmic contacts on p-type GaN using Ni/Pd/Au metallization”, Appl. Phys. Lett. vol. 77, pp. 3423-3425, 2000.

    Article  Google Scholar 

Download references

Acknowledgments

The author is thankful to Director CMSDS—DRDO, Kolkata, for his keen interest in the work. The author gratefully acknowledges the microelectronics research group of TU-Darmstadt, Germany headed by Prof. H. Hartnagel for their all valuable technical & experimental support to fabricate the device.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Moumita Mukherjee .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2014 Springer International Publishing Switzerland

About this paper

Cite this paper

Mukherjee, M. (2014). Large Signal Physical Operation of a III–V Nitride Based Double Velocity Transit Time Device: A Potential Source For THz Imaging. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_56

Download citation

Publish with us

Policies and ethics