Effect of Slow Traps on Capacitance–Voltage Measurement

  • Ankita Gangwar
  • Baquer Mazhari
Conference paper
Part of the Environmental Science and Engineering book series (ESE)


Charge density inside a two terminal device is probed using two different methods—integration of Capacitance–Voltage characteristic and integration of discharge current following a voltage step. Difference in the two measured values is explained due to presence of slow traps. Simulations are done to validate the proposed explanation.


Organic diode Slow traps Impedance spectroscopy 


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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Indian Institute of Technology KanpurKanpurIndia
  2. 2.Samtel Centre for Display TechnologyKanpurIndia

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