Hg/Cd Interdiffusion in Thin CdTe Film on HgCdTe Epilayer

  • Tapasya Jain
  • Anuradha Dhaul
  • Rachna Manchanda
  • Shiv Kumar
  • O. P. Thakur
  • R. K. Sharma
Part of the Environmental Science and Engineering book series (ESE)

Abstract

Cd/Hg Interdiffusion in CdTe passivation layers on HgCdTe epilayer by heat treatment under different annealing conditions have been studied using Secondary Ion Mass Spectrometry (SIMS). Cdmium and Mercury composition profiles have been generated from SIMS depth profiles. The results are important from the point of view of passivation of HgCdTe surface with CdTe layer of graded composition, in order to achieve flat band conditions at CdTe/HgCdTe interface and simultaneously adjusting metal vacancy concentration in the bulk of the material.

Keywords

HgCdTe CdTe Passivation Composition profiles 

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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  • Tapasya Jain
    • 1
    • 2
  • Anuradha Dhaul
    • 2
  • Rachna Manchanda
    • 2
  • Shiv Kumar
    • 2
  • O. P. Thakur
    • 1
  • R. K. Sharma
    • 2
  1. 1.Netaji Subhas Institute of TechnologyDwarka, New DelhiIndia
  2. 2.Solid State Physics LaboratoryDelhiIndia

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