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The Approach of Graphical User Interface Testing Guided by Bayesian Model

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Computer Engineering and Networking

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 277))

Abstract

GUI (graphical user interface) is becoming increasingly important in the software field for the reason that it is a friendly way for the users to interact with the software through GUI. Testing in GUI, however, is faced with many challenges, due to the immense number of event interactions. Testing all possible event interactions is impossible, since the number of required test case is huge in numbers. GUI testing mainly serves two goals: First, to establish confidence in assessment of GUI; Second, to find that more software defects in GUI testing while limiting the number of test cases. For this purpose, any testing method must be better at detecting defects. This article proposed a new technique that can be used for GUI testing, which can guide the GUI testing and find more defects as soon as possible. In this chapter, it introduces an approach of GUI testing guided by Bayesian model optimization scheme, discusses the Bayesian model topology and its issues encountered in the modeling process. It presents solutions in connection with the parameters problem. In the end, a simple case verifies the validity of the model during the GUI testing.

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Author information

Authors and Affiliations

  1. School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China

    Zhifang Yang, Zhongxing Yu & Chenggang Bai

Authors
  1. Zhifang Yang
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  2. Zhongxing Yu
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  3. Chenggang Bai
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Corresponding author

Correspondence to Zhifang Yang .

Editor information

Editors and Affiliations

  1. University of Texas at Dallas, Richardson, Texas, USA

    W. Eric Wong

  2. Chinese Academy of Sciences, Beijing, China, People’s Republic

    Tingshao Zhu

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© 2014 Springer International Publishing Switzerland

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Yang, Z., Yu, Z., Bai, C. (2014). The Approach of Graphical User Interface Testing Guided by Bayesian Model. In: Wong, W.E., Zhu, T. (eds) Computer Engineering and Networking. Lecture Notes in Electrical Engineering, vol 277. Springer, Cham. https://doi.org/10.1007/978-3-319-01766-2_44

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  • DOI: https://doi.org/10.1007/978-3-319-01766-2_44

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-01765-5

  • Online ISBN: 978-3-319-01766-2

  • eBook Packages: EngineeringEngineering (R0)

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