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Proceedings of the 8th International Conference on Computer Recognition Systems CORES 2013 pp 217–226Cite as

Statistical Analysis in Signature Recognition System Based on Levenshtein Distance

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 226))

Abstract

In this paper we develop our previously presented studies, where adaptation of the Levenshtein method in a signature recognition process is proposed. Three methods based on the normalized Levenshtein measure were taken into consideration. The studies included an analysis and selection of appropriate signature features, on the basis of which the authenticity of a signature was verified later. A statistical apparatus was used to perform a comprehensive analysis. Results obrained were tested by means of χ 2 independence test. It allowed determining the relationship between signature features and the errors of classifier.

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Authors and Affiliations

  1. Institute of Computer Science, University of Silesia, ul. Bedzinska 39, 41-200, Sosnowiec, Poland

    Malgorzata Palys, Rafal Doroz & Piotr Porwik

Authors
  1. Malgorzata Palys
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  2. Rafal Doroz
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  3. Piotr Porwik
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Corresponding author

Correspondence to Malgorzata Palys .

Editor information

Editors and Affiliations

  1. , Department of Systems and Computer, Wroclaw University of Technology, WybrzezeWyspianskiego St 27, Wroclaw, 50-370, Poland

    Robert Burduk

  2. , Department of Systems and Computer, Wroclaw University of Technology, WybrzezeWyspianskiego St 27, Wroclaw, 50-370, Poland

    Konrad Jackowski

  3. , Department of Systems and Computer, Wroclaw University of Technology, WybrzezeWyspianskiego St 27, Wroclaw, 50-370, Poland

    Marek Kurzynski

  4. , Department of Systems and Computer, Wroclaw University of Technology, WybrzezeWyspianskiego St 27, Wroclaw, 50-370, Poland

    Michał Wozniak

  5. , Department of Systems and Computer, Wroclaw University of Technology, WybrzezeWyspianskiego St, Wroclaw, 50-370, Poland

    Andrzej Zolnierek

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© 2013 Springer International Publishing Switzerland

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Palys, M., Doroz, R., Porwik, P. (2013). Statistical Analysis in Signature Recognition System Based on Levenshtein Distance. In: Burduk, R., Jackowski, K., Kurzynski, M., Wozniak, M., Zolnierek, A. (eds) Proceedings of the 8th International Conference on Computer Recognition Systems CORES 2013. Advances in Intelligent Systems and Computing, vol 226. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00969-8_21

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  • DOI: https://doi.org/10.1007/978-3-319-00969-8_21

  • Publisher Name: Springer, Heidelberg

  • Print ISBN: 978-3-319-00968-1

  • Online ISBN: 978-3-319-00969-8

  • eBook Packages: EngineeringEngineering (R0)

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