Abstract
Due to the high design complexity and the inaccurate abstracted models used in today’s VLSI design flow, pre-silicon verification process is not sufficient to eliminate all the errors. To tackle the remaining errors in the prototype silicon, in this book we introduce several innovative techniques to efficiently assist designers during post-silicon validation. Before delving into our solutions, we first review the trends of VLSI design and introduce various errors that occur in the design flow. We then summarize our validation techniques that resolve them.
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© 2014 Springer International Publishing Switzerland
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Liu, X., Xu, Q. (2014). Introduction. In: Trace-Based Post-Silicon Validation for VLSI Circuits. Lecture Notes in Electrical Engineering, vol 252. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00533-1_1
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DOI: https://doi.org/10.1007/978-3-319-00533-1_1
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Publisher Name: Springer, Heidelberg
Print ISBN: 978-3-319-00532-4
Online ISBN: 978-3-319-00533-1
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