Abstract
In the first part of this article actual trends in microelectronics are highlighted. These give rise to identify some topics of mathematical research, which are desirable to be solved in order to cope with future circuit simulation problems.
Parts of this research — which are fairly beyond the scope of industrial activities — are carried out by university partners, and are reported in other contributions to this book. Other parts, however, can only be pursued in close contacts to applications, which makes them better suited for industrial research. As an example, we will focus in the second part of this paper on actual own work on diagnosis. We give an overview of attempts to provide user oriented diagnostics in case of faulty circuit models, problems with coupling structural and functional descriptions, and failure of numerical integration due to high DAE index.
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Schwarz, D.E., Feldmann, U. (2003). Actual Problems of Circuit Simulation in Industry. In: Antreich, K., Bulirsch, R., Gilg, A., Rentrop, P. (eds) Modeling, Simulation, and Optimization of Integrated Circuits. ISNM International Series of Numerical Mathematics, vol 146. Birkhäuser, Basel. https://doi.org/10.1007/978-3-0348-8065-7_6
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DOI: https://doi.org/10.1007/978-3-0348-8065-7_6
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