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Polarized Light Microscopy (PLM) of Ferroelectric and Ferroelastic Domains in Transmitted and Reflected Light

  • Conference paper
Ferroelectric Ceramics

Part of the book series: Monte Verità ((MV))

Abstract

The importance of polarized light microscopy (PLM) for the study of the domains and phase transitions of ferroelectric and ferroelastic single crystals is pin-pointed and the experimental set-ups for observations and measurements between 4 and 1600K are outlined. The contrast formation between domains by spontaneous birefringence and reciprocal rotatory power in transmission, and by bireflectance, specular reflection and etching in reflected light are considered. A symmetry classification for the birefringence and rotatory power contrast formation is proposed. The use of PLM for ceramic materials encounters difficulties, which can be overcome by enhancing grain growth and reducing sources of light scattering. Some examples are given, demonstrating the great power of PLM, if used in conjunction with other physical measurements.

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Author information

Authors and Affiliations

  1. University of Geneva, CH-1211, Geneva 4, Switzerland

    Hans Schmid

Authors
  1. Hans Schmid
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Editor information

Editors and Affiliations

  1. Ecole Polytechnique Fédérale de Lausanne Lab. de Céramique, MX-D Ecublens, CH-1015, Lausanne, Switzerland

    N. Setter  & E. L. Colla  & 

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© 1993 Birkhäuser Verlag Basel

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Schmid, H. (1993). Polarized Light Microscopy (PLM) of Ferroelectric and Ferroelastic Domains in Transmitted and Reflected Light. In: Setter, N., Colla, E.L. (eds) Ferroelectric Ceramics. Monte Verità. Birkhäuser Basel. https://doi.org/10.1007/978-3-0348-7551-6_3

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  • DOI: https://doi.org/10.1007/978-3-0348-7551-6_3

  • Publisher Name: Birkhäuser Basel

  • Print ISBN: 978-3-0348-7553-0

  • Online ISBN: 978-3-0348-7551-6

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