Abstract
The superconductor-ferromagnetic transistor (SFT) is a novel cryogenic device with the potential to greatly enhance traditional single flux quantum circuits. Since SFT devices are under active development, compact models are necessary to include this device in the simulation of novel circuits. In this chapter, a simplified compact model of a three-terminal SFT device is described. The model fits the general I-V characteristics of existing devices with 7.4% mean absolute error, while also capturing the transient behavior of the device. The model has been implemented in Verilog-A and simulated in Cadence Spectre. The model enables the simulation of SFQ circuits containing SFT devices and is reconfigurable to support developments in SFT technology.
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References
T. Jabbari, M. Bocko, E.G. Friedman, All-JJ logic based on bistable JJs. IEEE Trans. Appl. Supercond. 33(5), 1–7 (2023)
T. Jabbari, J. Kawa, E.G. Friedman, H-tree clock synthesis in RSFQ circuits, in Proceedings of the IEEE Baltic Electronics Conference (2020), pp. 1–5
T. Jabbari, G. Krylov, J Kawa, E.G. Friedman, Splitter trees in single flux quantum circuits. IEEE Trans. Appl. Supercond. 31(5), 1302606 (2021)
G. Krylov, E.G. Friedman, Sense amplifier for spin-based cryogenic memory cells. IEEE Trans. Appl. Supercond. 29(5), 1–4 (2019). Art no. 1501804
I.P. Nevirkovets, O. Chernyashevskyy, G.V. Prokopenko, O.A. Mukhanov, J.B. Ketterson, Control of supercurrent in hybrid superconducting–ferromagnetic transistors. IEEE Trans. Appl. Supercond. 25(3), 1–5 (2015)
S. Shafranjuk, I.P. Nevirkovets, O.A. Mukhanov, J.B. Ketterson, Control of superconductivity in a hybrid superconducting/ferromagnetic multilayer using nonequilibrium tunneling injection. Phys. Rev. Appl. 6(2), 024018 (2016)
G. Krylov, E.G. Friedman, Behavioral verilog-A model of superconductor-ferromagnetic transistor, in Proceedings of the IEEE International Symposium on Circuits and Systems (2018)
A.I. Buzdin, Proximity effects in superconductor-ferromagnet heterostructures. Rev. Mod. Phys. 77(3), 935–976 (2005)
G. Krylov, E.G. Friedman, Design methodology for distributed large-scale ERSFQ bias networks. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 28(11), 2438–2447 (2020)
T. Jabbari, G. Krylov, E.G. Friedman, Logic locking in single flux quantum circuits. IEEE Trans. Appl. Supercond. 31(5) (2021)
Y. Mustafa, T. Jabbari, S. Köse, Emerging attacks on logic locking in SFQ circuits and related countermeasures. IEEE Trans. Appl. Supercond. 32(3), 1–8 (2022)
T. Jabbari, R. Bairamkulov, J. Kawa, E. Friedman, Interconnect benchmark circuits for single flux quantum integrated circuits. IEEE Trans. Appl. Supercond. (2023). Under review
K. Gaj, Q.P. Herr, V. Adler, A. Krasniewski, E.G. Friedman, M.J. Feldman, Tools for the computer-aided design of multigigahertz superconducting digital circuits. IEEE Trans. Appl. Supercond. 9(1), 18–38 (1999)
S.R. Whiteley, Josephson junctions in SPICE3, IEEE Trans. Magn. 27(2), 2902–2905 (1991)
T. Jabbari, VLSI Complexity Single Flux Quantum Systems, Ph.D. Dissertation, University of Rochester, Rochester, New York, 2023
I.P. Nevirkovets, S.E. Shafraniuk, O. Chernyashevskyy, D.T. Yohannes, O.A. Mukhanov, J.B. Ketterson, Investigation of current gain in superconducting-ferromagnetic transistors with high-\(j_c\) acceptor. IEEE Trans. Appl. Supercond. 27(4), 1–4 (2017)
I.P. Nevirkovets, S.E. Shafraniuk, O. Chernyashevskyy, D.T. Yohannes, O.A. Mukhanov, J.B. Ketterson, Critical current gain in high-jc superconducting-ferromagnetic transistors. IEEE Trans. Appl. Supercond. 26(8), 1–7 (2016)
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Krylov, G., Jabbari, T., Friedman, E.G. (2024). Compact Model of Superconductor-Ferromagnetic Transistors. In: Single Flux Quantum Integrated Circuit Design. Springer, Cham. https://doi.org/10.1007/978-3-031-47475-0_21
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DOI: https://doi.org/10.1007/978-3-031-47475-0_21
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