Abstract
In this study, we address the limitations of digital twins, including significant computational time and the complexity of real-world processes, by utilizing surrogate models (SMs) to partially or entirely represent digital twins. We investigate the performance of surrogate models in a manufacturing system scenario through sensitivity analysis and adaptive sampling strategies with incremental learning. Our experimental setup involves a synthetic digital twin and a neural network-based surrogate model. The study explores the impact of various parameters such as dataset size, number of epochs, and batch size on the neural network’s performance. We also analyze the effectiveness of different adaptive sampling strategies in the incremental learning process.
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Casal, A.G., García, A.P. (2023). Sensitivity Analysis of Surrogate Modeling for Manufacturing in Digital Twins. In: Mehmood, R., et al. Distributed Computing and Artificial Intelligence, Special Sessions I, 20th International Conference. DCAI 2023. Lecture Notes in Networks and Systems, vol 741. Springer, Cham. https://doi.org/10.1007/978-3-031-38318-2_29
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DOI: https://doi.org/10.1007/978-3-031-38318-2_29
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