Abstract
Thermal noise, which is sampled and aliases in-band in discrete-time systems, limits the achievable performance of switched-capacitor noise-shaping Analog-to-Digital Converters (ADCs). While the performance of such ADCs has advanced significantly over the last 20 years, as quantified by the Schreier figure of merit (FoMS), the theoretical limit of 192 dB remains unchallenged. Over that period, the envelope of ADC performance has advanced from a FoMS of 163 dB, 20 years ago, to 186 dB today, with a rate of advancement, corresponding to ADC performance, which is doubling every 1.6 years. However, this rate of advancement has started to slow in recent years. This chapter will review some of the recent advancements in relation to reducing the thermal noise in switched-capacitor Delta-Sigma Modulators. In addition, this chapter will address many of the challenges associated with breaking the 192 dB FoMS performance barrier.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
R. Kapusta, H. Zhu, C. Lyden, Sampling circuits that break the kT/C thermal noise limit. IEEE J. Solid-State Circuits 49(8), 1694–1701 (2014)
M. Pelgrom, Analog-to-Digital Conversion, 3rd edn. (Springer, 2017)
B. Murmann, The race for the extra decibel: A brief review of current ADC performance trajectories. IEEE L. Solid-State Circuit Magazine 7(3), 58–66 (2015)
Murmann, ADC performance survey 1997–2022 [Online]. http://web.stanford.edu/~murmann/adcsurvey.html
M. Keller, B. Murmann, Y. Manoli, Analog-digital interfaces, NANO-CHIPS 2020 (Springer, 2010), pp. 93–116
B. Murmann, M. Verhelst, Y. Manoli, Analog-to-information conversion, NANO-CHIPS 2030 (Springer, 2020), pp. 275–292
B. Murmann, A/D converter trends: Power dissipation, scaling and digitally assisted architectures (Proc. IEEE Custom Integrated Circuits Conf, 2008), pp. 105–112
C.C. Enz, E.A. Vittoz, CMOS Low-Power Analog Circuit Design (Emerging Technologies: Designing Low Power Digital Systems, 1996), pp. 81–82
E.A. Vittoz, Future of analog in the VLSI environment, vol 2 (IEEE International Symposium on Circuits and Systems, 1990), pp. 1372–1375
B.J. Hosticka, Performance comparison of analog and digital circuits. Proc. IEEE 73(1), 25–29 (1985)
J. Liu, X. Tang, W. Zhao, L. Shen, N. Sun, A 13-bit 0.005-mm2 40-MS/s SAR ADC with kT/C noise cancellation. IEEE J. Solid-State Circuits 55(12), 3260–3270 (2020)
H. Chandrakumar, D. Marković, A 15.2-ENOB 5-kHz BW 4.5- μ W chopped CT ΔΣ -ADC for artifact-tolerant neural recording front ends. IEEE Journal of Solid-State Circuits 53(12), 3470–3483 (2018)
S. Pavan, R. Schreier, G.C. Temes, Understanding delta-sigma data converters, 2nd edn. (IEEE Press, Wiley, 2017)
J. de la Rosa, Sigma-delta converters: practical design guide, 2nd edn. (IEEE Press, Wiley, 2018)
S. Norsworthy, R. Schreier, G. Temes, Delta-sigma data converters: Theory, design and simulation (IEEE Press, Wiley, 1997)
S. Kalogiros, G. Salgado, K. McCarthy, I. O’Connell, Behavioral modeling of low-frequency noise in switched-capacitor circuits using python (2022 20th IEEE Interregional NEWCAS Conference (NEWCAS), 2022), pp. 446–449
K. Martin, A. Sedra, Effects of the op amp finite gain and bandwidth on the performance of switched-capacitor filters. IEEE Trans. Circuit System 28(8), 822–829 (1981)
B. Razavi, Design of analog CMOS integrated circuits, 2nd edn. (McGraw Hill, New York, 2017)
S.-E. Hsieh, C.-C. Hsieh, A 0.4V 13b 270kS/S SAR-ISDM ADC with an opamp-less time-domain integrator (2018 IEEE International Solid – State Circuits Conference – (ISSCC), 2018), pp. 240–242
J. Steensgaard, R. Reay, R. Perry, D. Thomas, G. Tu, G. Reitsma, A 24b 2MS/s SAR ADC with 0.03ppm INL and 106.3dB DR in 180nm CMOS (2022 IEEE International Solid-State Circuits Conference (ISSCC), 2022), pp. 168–170
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2023 The Author(s), under exclusive license to Springer Nature Switzerland AG
About this chapter
Cite this chapter
Kalogiros, S., Salgado, G., Lyden, C., McCarthy, K., O’Connell, I. (2023). Pushing the Limits of kT/C Noise in Delta-Sigma Modulators. In: Harpe, P., Baschirotto, A., Makinwa, K.A. (eds) Biomedical Electronics, Noise Shaping ADCs, and Frequency References. Springer, Cham. https://doi.org/10.1007/978-3-031-28912-5_11
Download citation
DOI: https://doi.org/10.1007/978-3-031-28912-5_11
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-031-28911-8
Online ISBN: 978-3-031-28912-5
eBook Packages: EngineeringEngineering (R0)