Abstract
This chapter presents the results of the computations of the second-order sensitivities of the PERP (polyethylene-reflected plutonium) benchmark’s computed leakage response with respect to the benchmark’s 21,600 parameters underlying the group-averaged isotopic scattering cross sections. The numerical results obtained indicate that the vast majority of the (21,600)2 second-order sensitivities with respect to the scattering cross sections were much smaller than the corresponding first-order ones. Consequently, it shows that the effects of variances in the scattering cross sections on the expected value, variance, and skewness of the response distribution were negligible in comparison to the corresponding effects stemming from uncertainties in the total cross sections, which were presented in Chap. 2. On the other hand, it was found that 52 of the mixed second-order sensitivities of the leakage response with respect to the scattering and total microscopic cross sections had values that were significantly larger than the unmixed second-order sensitivities of the leakage response with respect to the group-averaged scattering microscopic cross sections.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Cacuci DG (2019c) BERRU predictive modeling: best estimate results with reduced uncertainties. Springer, Heidelberg/New York
Cacuci DG, Fang R, Favorite JA (2019a) Comprehensive second-order adjoint sensitivity analysis methodology (2nd-ASAM) applied to a subcritical experimental reactor physics benchmark: I. Effects of imprecisely known microscopic total and capture cross sections. Energies 12(21):4219. https://doi.org/10.3390/en12214219
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2023 The Author(s), under exclusive license to Springer Nature Switzerland AG
About this chapter
Cite this chapter
Cacuci, D.G., Fang, R. (2023). Second-Order Analysis: Effects of Scattering Cross Sections. In: The nth-Order Comprehensive Adjoint Sensitivity Analysis Methodology, Volume II. Springer, Cham. https://doi.org/10.1007/978-3-031-19635-5_3
Download citation
DOI: https://doi.org/10.1007/978-3-031-19635-5_3
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-031-19634-8
Online ISBN: 978-3-031-19635-5
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)