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Statistical Analysis of Time-to-Breakdown Data

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Fiber Bundles

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Abstract

In this chapter, we consider the data from Figures 3, 6, and 14 in Kim and Lee (2004) as well as their Weibull analyses of these figures and analysis of their Figure 14. We use this data to see the role that the Weibull plays in their analysis, the physical interpretation of the Weibull shape and scale, and the BD formalism. In addition, other distributions are used to compare with the Weibull and to study the legitimacy of some of the BD formalism assumptions.

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Notes

  1. 1.

    The original data for Figures 3 and 6 of Kim and Lee’s is not available. The figures and analyses in Chapter 8 are based on data we constructed visually from Figures 3 and 6. We want to thank Professor Jack C. Lee for his efforts, though unsuccessful, in trying to provide the original data. We also want to thank Professor Jia-Liang Le for the cycles to failure data for Kim and Lee’s (2004) Figure 14; Le used this in his (2012) Figure 4 Weibull plots.

References

  • Kim, Y.-H., & Lee, J. C. (2004). Reliability characteristics of high-k dielectrics. Microelectronics Reliability, 44(2), 183–193.

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  • Le, J.-L. (2012). A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectronics Reliability, 52(1), 100–106.

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Author information

Authors and Affiliations

  1. Worcester, MA, USA

    James U. Gleaton

  2. Management of Science and Statistics, University of Texas at San Antonio, San Antonio, TX, USA

    David Han

  3. Department of Statistics, University of South Carolina, Columbia, SC, USA

    James D. Lynch

  4. Department of Mathematical Sciences, Bentley University, Waltham, MA, USA

    Hon Keung Tony Ng

  5. Istituto di Matematica Applicata e Tecnologie Informatiche, Consiglio Nazionale delle Ricerche, Milano, Italy

    Fabrizio Ruggeri

Authors
  1. James U. Gleaton
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  2. David Han
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  3. James D. Lynch
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  4. Hon Keung Tony Ng
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  5. Fabrizio Ruggeri
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Corresponding author

Correspondence to James U. Gleaton .

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Gleaton, J.U., Han, D., Lynch, J.D., Ng, H.K.T., Ruggeri, F. (2022). Statistical Analysis of Time-to-Breakdown Data. In: Fiber Bundles. Springer, Cham. https://doi.org/10.1007/978-3-031-14797-5_8

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