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Effective resistance of finite grids

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Abstract

Conventional numerical circuit analysis tools typically scale superlinearly with the number of nodes. With the rapid increase in the number of nodes in modern VLSI systems, alternative methods are required. The effective resistance is an important characteristic of electrical systems, which is used to simplify the circuit analysis process. An infinite resistive rectangular mesh is commonly assumed in the analysis of grid structures to determine the effective resistance of a grid. The assumption of infinity provides a useful approximation when a large grid is analyzed far from the boundaries. If however the grid is analyzed in close proximity to a boundary or if the grid dimensions are small, the assumption of infinity may lead to significant error. To address this issue, the infinity mirror technique is proposed to determine the effective resistance of a two-dimensional structure, where one or both dimensions are finite. The runtime of the proposed method does not depend on the size of the grid and exhibits good agreement with nodal analysis, achieving an error below 1 Based on the infinity mirror technique, IR drops can be accurately determined at arbitrary points within a mesh without considering the entire grid. The infinity mirror technique therefore greatly accelerates the IR drop analysis process in large grids by exclusively determining the electric potential at a few nodes of primary interest. A 1,400 fold speedup is achieved in the analysis of 100 nodes within a 103 × 104 grid.

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Bairamkulov, R., Friedman, E. (2023). Effective resistance of finite grids. In: Graphs in VLSI. Springer, Cham. https://doi.org/10.1007/978-3-031-11047-4_7

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  • DOI: https://doi.org/10.1007/978-3-031-11047-4_7

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