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Low-Dimensional Semiconductor Materials for X-Ray Detection

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Advanced X-Ray Radiation Detection:

Abstract

Traditional materials for scintillation-imaging screens or direct conversion detectors suffer from disadvantages including high cost, fragility, and poor photophysical properties. These highlighting disadvantages limit the quality of X-ray detection, and further impede the commercial application of X-ray. Luckily, low-dimensional semiconductors (LD), such as metal halide perovskites, classical inorganic semiconductors, and metal-organic frameworks, etc., possess Quantum well effect and Quantum size effect, emerging as alternative materials to conquer these problems. Moreover, some LD materials show outstanding properties of high photoluminescence quantum yields (PLQY), superior carrier lifetime produces, tunable bandgap, and low-temperature fabrication process, which ensures them as a competitive selection for X-ray detection. In this book chapter, firstly, the working mechanism and essential parameters of the direct and indirect X-ray detector are introduced. Then, advanced works based on LD semiconductors are systematically presented in both direct and indirect X-ray detection, as well as their application in X-ray imaging. Finally, the remaining challenges and our perspectives in the field of LD semiconductor-based X-ray detection are also summarized, mainly focusing on material design, stability, device structure, and device performance.

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Authors and Affiliations

  1. School of Physical Science and Technology, Lanzhou University, Lanzhou, China

    Zhiwen Jin, Zhizai Li, Wei Lan & Qian Wang

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  1. Zhiwen Jin
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  2. Zhizai Li
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    Krzysztof (Kris) Iniewski

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Jin, Z., Li, Z., Lan, W., Wang, Q. (2023). Low-Dimensional Semiconductor Materials for X-Ray Detection. In: Iniewski, K.(. (eds) Advanced X-Ray Radiation Detection: . Springer, Cham. https://doi.org/10.1007/978-3-030-92989-3_2

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