Abstract
The first objective of this presentation is to show that it is possible to explain the cause of the pattern-induced bias (PIB) observed in displacement fields obtained by local DIC. A model is presented for this purpose. It gathers the different errors made when retrieving this displacement by minimizing the optical residual over subsets. It is shown that PIB predicted with this model and its counterpart observed with displacement fields obtained with DIC are in good agreement. When DIC is applied on periodic patterns like checkerboards instead of random speckles, it is observed that PIB becomes negligible. Such regular patterns are however not well suited for DIC. Hence it is recalled how to process such images by minimizing the optical residual in the Fourier domain instead of the spatial one. PIB is assessed in this case, and it is also observed that PIB is negligible in displacement maps obtained with such regular patterns processed by minimizing the optical residual in the Fourier domain.
Keywords
- Checkerboard
- Digital image correlation
- Pattern-induced bias
- Localized spectrum analysis
- Uncertainty quantification
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Blaysat, B., Grédiac, M., Sur, F.: On the propagation of camera sensor noise to displacement maps obtained by DIC. Exp. Mech. 56(6), 919–944 (2016)
Schreier, H.W., Braasch, J.R., Sutton, M.: Systematic errors in digital image correlation caused by intensity interpolation. Optim. Eng. 39(11), 2915–2921 (2000)
Schreier, H.W., Sutton, M.A.: Systematic errors in digital image correlation due to undermatched subset shape functions. Exp. Mech. 42(3), 303–310 (2002)
Lehoucq, R.B., Reu, P.L., Turner, D.Z.: The effect of the ill-posed problem on quantitative error assessment in digital image correlation. Exp Mech. 2017, 1–13 (2017)
Fayad, S., Seidl, D.T., Reu, P.L.: Spatial DIC errors due to pattern-induced bias and grey level discretization. Exp. Mech. 60(2), 249–263 (2020)
Sur, F., Blaysat, B., Grédiac, M.: On biases in displacement estimation for image registration, with a focus on photomechanics. J Math Imag Vision. 63, 777–806 (2021)
Grédiac, M., Sur, F.: Effect of sensor noise on the resolution and spatial resolution of the displacement and strain maps obtained with the grid method. Strain. 50(1), 1–27 (2014)
2D Challenge 2.0 discussion document. https://sem.org/dicchallenge
Grédiac, M., Blaysat, B., Sur, F.: A critical comparison of some metrological parameters characterizing local digital image correlation and grid method. Exp. Mech. 57(6), 871–903 (2017)
Grédiac, M., Blaysat, B., Sur, F.: On the optimal pattern for displacement field measurement: random speckle and DIC, or checkerboard and LSA? Exp. Mech. 60(4), 509–534 (2020)
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Sur, F., Blaysat, B., Grédiac, M. (2022). Which Pattern for a Low Pattern-Induced Bias?. In: Kramer, S.L., Tighe, R., Lin, MT., Furlong, C., Hwang, CH. (eds) Thermomechanics & Infrared Imaging, Inverse Problem Methodologies, Mechanics of Additive & Advanced Manufactured Materials, and Advancements in Optical Methods & Digital Image Correlation, Volume 4. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-030-86745-4_15
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DOI: https://doi.org/10.1007/978-3-030-86745-4_15
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