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Integrated Circuits

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Design for Testability, Debug and Reliability

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Abstract

This chapter introduces the basic principles of the IC design and test. Furthermore, measurements are introduced, which ensure that the later IC design holds a high level of testability and reliability if this is required for the intended application. In particular, the abstract circuit model is presented in Sect. 2.1 and the principles of circuit test are described in Sect. 2.2. This includes the structural test in Sect. 2.2.1 and the functional test in Sect. 2.2.2.

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Notes

  1. 1.

    A single clock domain is assumed to ease the following descriptions. However, all proposed techniques in the remainder of this book can be extended to further clock domains.

  2. 2.

    In the remainder of this work, a test stimulus is called test pattern.

  3. 3.

    Note that the concept of FSM is introduced detailed in Sect. 3.6 on page 49.

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  1. University of Bremen and DFKI GmbH, Bremen, Germany

    Sebastian Huhn & Rolf Drechsler

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Huhn, S., Drechsler, R. (2021). Integrated Circuits. In: Design for Testability, Debug and Reliability. Springer, Cham. https://doi.org/10.1007/978-3-030-69209-4_2

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  • DOI: https://doi.org/10.1007/978-3-030-69209-4_2

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