Abstract
Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses. In this way, this chapter evaluates the potential of the circuit-level techniques to reduce the soft error susceptibility of FinFET logic cells. A comparison between the single event transient (SET) cross section and SET pulse width is shown, considering different linear energy transfer (LET) values, supply voltages, and input vectors.
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References
de Aguiar, Y., Artola, L., Hubert, G., Meinhardt, C., Kastensmidt, F., Reis, R.: Evaluation of radiation-induced soft error in majority voters designed in 7nm FinFET technology. Microelectron. Reliab. 76–77, 660–664 (2017)
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Zimpeck, A.L., Meinhardt, C., Artola, L., Hubert, G., kastensmidt, F.L., Reis, R.A.L.: Circuit-level hardening techniques to mitigate soft errors in FinFET logic gates. In: European Conference on Radiation and its Effects on Components and Systems (RADECS), pp. 1–4 (2019)
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Zimpeck, A., Meinhardt, C., Artola, L., Reis, R. (2021). Soft Error Mitigation. In: Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs. Springer, Cham. https://doi.org/10.1007/978-3-030-68368-9_7
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DOI: https://doi.org/10.1007/978-3-030-68368-9_7
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