Abstract
There are several strategies to investigate the process variation impact and the soft error susceptibility. This chapter focuses on providing all the details about the methodologies adopted to improve the circuit’s reliability. First, we present the complete design flow of this work, since the choice of circuits for evaluation until obtain process variation and soft error estimations. For process variations, a parameter is modeled as a Gaussian function and inserted in the circuit using the Monte Carlo method through electrical simulations. The soft error weakness is evaluated using the MUSCA SEP3 tool developed by ONERA. This prediction tool is also based on the Monte Carlo method that deals with both the layout characteristics and the electrical properties of devices.
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Zimpeck, A., Meinhardt, C., Artola, L., Reis, R. (2021). Evaluation Methodology. In: Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs. Springer, Cham. https://doi.org/10.1007/978-3-030-68368-9_5
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DOI: https://doi.org/10.1007/978-3-030-68368-9_5
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