Abstract
In this chapter, concepts related to embedded system reliability are introduced. Distinction among failure, error, and fault is clarified. Related fault analysis techniques such as FTA, FMEA, and fault injection are discussed. Some aspects of fault testing and dependability are outlined. Finally, the concept of redundancy is introduced to improve reliability of embedded systems.
Reliability becomes much more important than the cost.—Jeff Bezos, Founder of Amazon
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References
J.C. Laprie, Dependable Computing and Fault Tolerance: Concepts and Terminology, Proc. 15th IEEE Int'l Symp. Fault-Tolerant Computing (FTCS-15), pp. 2–11, June 1985
R. Denning, Applied R&M Manual for Defense Systems, 2012
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Exercise
Exercise
Problem 6.1: What are the differences between failure, error, and fault? Describe with an example.
Problem 6.2: Define MTTF, MTBF, and MTTR. How availability of ES is related to these metrics?
Problem 6.3: For a repairable ES, the failure rate is 5 failures per million hours. If the mean time to repair is 300 h, determine the availability of the system.
Problem 6.4: Describe 3 fault analysis methods for ES.
Problem 6.5: How can you improve reliability of an ES system? Give two examples.
Problem 6.6: For an ES with network of sub-systems shown below with reliabilities R1 = 0.1, R2 = 0.7, R3 = 0.2, R4 = 0.8, and R5 = 0.4, calculate the overall reliability of the ES.
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Morshed, B.I. (2021). Reliability of ES. In: Embedded Systems – A Hardware-Software Co-Design Approach. Springer, Cham. https://doi.org/10.1007/978-3-030-66808-2_6
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DOI: https://doi.org/10.1007/978-3-030-66808-2_6
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Publisher Name: Springer, Cham
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Online ISBN: 978-3-030-66808-2
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