Skip to main content

Diversified Mutual Learning for Deep Metric Learning

  • Conference paper
  • First Online:
Computer Vision – ECCV 2020 Workshops (ECCV 2020)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 12535))

Included in the following conference series:

Abstract

Mutual learning is an ensemble training strategy to improve generalization by transferring individual knowledge to each other while simultaneously training multiple models. In this work, we propose an effective mutual learning method for deep metric learning, called Diversified Mutual Metric Learning, which enhances embedding models with diversified mutual learning. We transfer relational knowledge for deep metric learning by leveraging three kinds of diversities in mutual learning: (1) model diversity from different initializations of models (2) temporal diversity from different frequencies of parameter update, and (3) view diversity from different augmentations of inputs. Our method is particularly adequate for inductive transfer learning at the lack of large-scale data, where the embedding model is initialized with a pretrained model and then fine-tuned on a target dataset. Extensive experiments show that our method significantly improves individual models as well as their ensemble. Finally, the proposed method with a conventional triplet loss achieves the state-of-the-art performance of Recall@1 on standard datasets: 69.9 on CUB-200–2011 and 89.1 on CARS-196.

W. Park and W. Kim—Equal contribution.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Anil, R., Pereyra, G., Passos, A., Ormandi, R., Dahl, G.E., Hinton, G.E.: Large scale distributed neural network training through online distillation. arXiv preprint arXiv:1804.03235 (2018)

  2. Chen, Y., Wang, N., Zhang, Z.: Darkrank: accelerating deep metric learning via cross sample similarities transfer. In: Thirty-Second AAAI Conference on Artificial Intelligence (2018)

    Google Scholar 

  3. Deng, J., Guo, J., Xue, N., Zafeiriou, S.: Arcface: additive angular margin loss for deep face recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4690–4699 (2019)

    Google Scholar 

  4. Ge, W.: Deep metric learning with hierarchical triplet loss. In: Proceedings of the European Conference on Computer Vision (ECCV), pp. 269–285 (2018)

    Google Scholar 

  5. Hadsell, R., Chopra, S., LeCun, Y.: Dimensionality reduction by learning an invariant mapping. In: 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR’06), vol. 2, pp. 1735–1742. IEEE (2006)

    Google Scholar 

  6. He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2016)

    Google Scholar 

  7. Hinton, G., Vinyals, O., Dean, J.: Distilling the knowledge in a neural network. arXiv preprint arXiv:1503.02531 (2015)

  8. Huang, Z., Wang, N.: Like what you like: knowledge distill via neuron selectivity transfer. arXiv preprint arXiv:1707.01219 (2017)

  9. Ioffe, S., Szegedy, C.: Batch normalization: accelerating deep network training by reducing internal covariate shift. arXiv preprint arXiv:1502.03167 (2015)

  10. Jacob, P., Picard, D., Histace, A., Klein, E.: Metric learning with horde: high-order regularizer for deep embeddings. In: The IEEE International Conference on Computer Vision (ICCV), Oct 2019

    Google Scholar 

  11. Kim, W., Goyal, B., Chawla, K., Lee, J., Kwon, K.: Attention-based ensemble for deep metric learning. In: The European Conference on Computer Vision (ECCV) (2018)

    Google Scholar 

  12. Kingma, D.P., Ba, J.: Adam: a method for stochastic optimization. arXiv preprint arXiv:1412.6980 (2014)

  13. Krause, J., Stark, M., Deng, J., Fei-Fei, L.: 3d object representations for fine-grained categorization. In: 4th International IEEE Workshop on 3D Representation and Recognition (3dRR-13) (2013)

    Google Scholar 

  14. Liu, Y., et al.: Knowledge distillation via instance relationship graph. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 7096–7104 (2019)

    Google Scholar 

  15. Liu, Z., Luo, P., Qiu, S., Wang, X., Tang, X.: Deepfashion: powering robust clothes recognition and retrieval with rich annotations. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1096–1104 (2016)

    Google Scholar 

  16. Movshovitz-Attias, Y., Toshev, A., Leung, T.K., Ioffe, S., Singh, S.: No fuss distance metric learning using proxies. CoRR abs/1703.07464 (2017). http://arxiv.org/abs/1703.07464

  17. Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2016)

    Google Scholar 

  18. Opitz, M., Waltner, G., Possegger, H., Bischof, H.: Deep metric learning with bier: boosting independent embeddings robustly. IEEE Trans. Pattern Anal. Mach. Intell. (2018). https://doi.org/10.1109/TPAMI.2018.2848925

    Article  Google Scholar 

  19. Park, W., Kim, D., Lu, Y., Cho, M.: Relational knowledge distillation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3967–3976 (2019)

    Google Scholar 

  20. Paszke, A., et al: Automatic differentiation in pytorch (2017)

    Google Scholar 

  21. Qian, Q., Shang, L., Sun, B., Hu, J., Li, H., Jin, R.: Softtriple loss: deep metric learning without triplet sampling. arXiv preprint arXiv:1909.05235 (2019)

  22. Romero, A., Ballas, N., Kahou, S.E., Chassang, A., Gatta, C., Bengio, Y.: Fitnets: hints for thin deep nets. International Conference on Learning Representations (2015)

    Google Scholar 

  23. Roth, K., Brattoli, B., Ommer, B.: Mic: mining interclass characteristics for improved metric learning. In: The IEEE International Conference on Computer Vision (ICCV), October 2019

    Google Scholar 

  24. Russakovsky, O., et al.: ImageNet large scale visual recognition challenge. Int. J. Comput. Vis. 115(3), 211–252 (2015). https://doi.org/10.1007/s11263-015-0816-y

    Article  MathSciNet  Google Scholar 

  25. Sanakoyeu, A., Tschernezki, V., Buchler, U., Ommer, B.: Divide and conquer the embedding space for metric learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 471–480 (2019)

    Google Scholar 

  26. Schroff, F., Kalenichenko, D., Philbin, J.: Facenet: a unified embedding for face recognition and clustering. In: The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2015)

    Google Scholar 

  27. Suh, Y., Han, B., Kim, W., Lee, K.M.: Stochastic class-based hard example mining for deep metric learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 7251–7259 (2019)

    Google Scholar 

  28. Ustinova, E., Lempitsky, V.: Learning deep embeddings with histogram loss. In: Advances in Neural Information Processing Systems, pp. 4170–4178 (2016)

    Google Scholar 

  29. Wah, C., Branson, S., Welinder, P., Perona, P., Belongie, S.: The Caltech-UCSD Birds-200-2011 Dataset. Technical report CNS-TR-2011-001, California Institute of Technology (2011)

    Google Scholar 

  30. Wang, X., Han, X., Huang, W., Dong, D., Scott, M.R.: Multi-similarity loss with general pair weighting for deep metric learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 5022–5030 (2019)

    Google Scholar 

  31. Wu, C.Y., Manmatha, R., Smola, A.J., Krahenbuhl, P.: Sampling matters in deep embedding learning. In: The IEEE International Conference on Computer Vision (ICCV) (2017)

    Google Scholar 

  32. Yi, D., Lei, Z., Li, S.: Deep metric learning for practical person re-identification. ArXiv e-prints (2014)

    Google Scholar 

  33. Yu, B., Tao, D.: Deep metric learning with tuplet margin loss. In: The IEEE International Conference on Computer Vision (ICCV), October 2019

    Google Scholar 

  34. Yu, L., Yazici, V.O., Liu, X., Weijer, J.V.D., Cheng, Y., Ramisa, A.: Learning metrics from teachers: compact networks for image embedding. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2907–2916 (2019)

    Google Scholar 

  35. Yuan, Y., Yang, K., Zhang, C.: Hard-aware deeply cascaded embedding. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 814–823 (2017)

    Google Scholar 

  36. Zagoruyko, S., Komodakis, N.: Paying more attention to attention: improving the performance of convolutional neural networks via attention transfer. International Conference on Learning Representations (2017)

    Google Scholar 

  37. Zhai, A., Wu, H.Y.: Classification is a strong baseline for deep metric learning. arXiv preprint arXiv:1811.12649 (2018)

  38. Zhai, A., Wu, H.Y., San Francisco, U.: Classification is a strong baseline for deep metric learning (2019)

    Google Scholar 

  39. Zhang, Y., Xiang, T., Hospedales, T.M., Lu, H.: Deep mutual learning. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4320–4328 (2018)

    Google Scholar 

Download references

Acknowledgement

This work was partly supported by Institute for Information & communications Technology Promotion (IITP) grant funded by the Korea government (MSIP) (No. 2019-0-01906, Artificial Intelligence Graduate School Program (POSTECH)) and Basic Science Research Program (NRF-2017R1E1A1A01077999) through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Wonpyo Park .

Editor information

Editors and Affiliations

1 Electronic supplementary material

Below is the link to the electronic supplementary material.

Supplementary material 1 (mp4 4596 KB)

Rights and permissions

Reprints and permissions

Copyright information

© 2020 Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Park, W., Kim, W., You, K., Cho, M. (2020). Diversified Mutual Learning for Deep Metric Learning. In: Bartoli, A., Fusiello, A. (eds) Computer Vision – ECCV 2020 Workshops. ECCV 2020. Lecture Notes in Computer Science(), vol 12535. Springer, Cham. https://doi.org/10.1007/978-3-030-66415-2_49

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-66415-2_49

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-66414-5

  • Online ISBN: 978-3-030-66415-2

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics