Abstract
The studies of micro and nano materials from the view point of topography and electronic structure are now very important for applications. Some techniques are already explained in Sect. 3.6.d. For topographic imaging of nano-materials, atomic force microscopy (AFM) as well as scanning tunneling microscopy (STM) are widely applied. In the case of magnetic materials, magnetic force miscroscopy (MFM) and spin-polarized STM techniques are applicable. In MFM, the magnetic stray field is probed by a magnetically covered pyramidal tip [1].
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Suga, S., Sekiyama, A., Tusche, C. (2021). Surface Spectroscopy by Scanning Tunneling Microscope. In: Photoelectron Spectroscopy. Springer Series in Surface Sciences, vol 72. Springer, Cham. https://doi.org/10.1007/978-3-030-64073-6_15
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