Abstract
Adding submicrometer lateral resolution to the analytic capabilities of photoelectron spectroscopy was a milestone that opened up new opportunities to access lateral fluctuations in the chemical composition and electronic and magnetic structure of surfaces and interfaces and to explore exotic properties of nanostructured matter. To achieve a high spatial resolution while preserving the spectral resolution of this technique requires the very intense photon flux that has become available with the advent of third-generation synchrotron storage rings. The high spatial resolution of x-ray photoelectron microscopes, operated at synchrotron facilities, is achieved by either: (i) magnifying the image of the irradiated surface area using a suitable electron optical imaging system; or (ii) demagnifying the incident photon beam using x-ray photon optics. The contrast mechanisms in both instruments are based on photon absorption and the photon-induced electron emission is used to obtain spectroscopic information encoding the composition and electronic structure of the sample under investigation.
This paper offers a brief overview of the history, operational principles and potential of scanning photoelectron microscopes where the imaging is performed by scanning the sample with respect to the focused beam.
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Amati, M., Barinov, A., Gregoratti, L., Sezen, H., Kiskinova, M. (2020). Scanning Photoelectron Microscopy: Past, Present and Future. In: Rocca, M., Rahman, T.S., Vattuone, L. (eds) Springer Handbook of Surface Science. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-46906-1_14
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DOI: https://doi.org/10.1007/978-3-030-46906-1_14
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