Skip to main content

Requirement-Adapted Enhancement of a Faraday Rotation Magnetometer’s Output

  • Conference paper
  • First Online:
Computer Aided Systems Theory – EUROCAST 2019 (EUROCAST 2019)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 12014))

Included in the following conference series:

  • 907 Accesses

Abstract

Magnetic microstructures are a useful tool to encode information. In order to repeatedly make use of this information a non-destructive measurement system is needed. Such a system would be applicable to many technical problems, however, within this contribution we discuss a method to analyse the magnetic pattern of the security thread used in banknotes specifically. In order to assess the quality of the threads’ magnetic patterns during their production, a previous study used a Faraday Rotation Magnetometer (FRM). An FRM is a magneto-optical – and therefore non-destructive and non-contacting – setup based on the Faraday effect, which correlates the strength of a magnetic field with the rotation of polarised light. Albeit meeting the required specifications, this FRM’s amplitude resolution wasn’t sufficient to allow meaningful quantitative measurements. Hence, within this contribution we discuss the suitability and scope of an FRM for quantitative measurements of magnetic microstructures. We present a generalised version of the previous FRM and characterise it with regard to its amplitude, spatial, and temporal resolution. We point out ways to enhance the signal and show the limitations of such measures separately as well as comprehensively. From this we derive a way to estimate the feasibility of an FRM as a quantitative measurement device for a given set of parameters. Furthermore, this contribution may be used as a build and signal enhancement guideline for a similar setup.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Pedrotti, F., Pedrottti, L., Bausch, W., Schmidt, H.: Introduction to Optics, 2nd edn. Pearson Education Company, London (1993)

    Google Scholar 

  2. Tumanski, S.: Handbook of Magnetic Measurements. CRC Press, Taylor & Francis Group, Boca Raton, Milton Park (2011)

    Google Scholar 

  3. Egger, J., Zagar, B.: In-line processing of Faraday-magnetometer scans. In: Proceedings of EUROCAST 2017 (2017)

    Google Scholar 

  4. Piepgras, R., Michlmayr, S., Zagar, B.: Optical analysis of magnetic microstructures. In: Proceedings of IMEKO Joint TC1 - TC2 Symposium on Photonics and Education in Measurement Sciences 2019 (2019)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Ruben Piepgras .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2020 Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Piepgras, R., Michlmayr, S., Zagar, B. (2020). Requirement-Adapted Enhancement of a Faraday Rotation Magnetometer’s Output. In: Moreno-Díaz, R., Pichler, F., Quesada-Arencibia, A. (eds) Computer Aided Systems Theory – EUROCAST 2019. EUROCAST 2019. Lecture Notes in Computer Science(), vol 12014. Springer, Cham. https://doi.org/10.1007/978-3-030-45096-0_7

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-45096-0_7

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-45095-3

  • Online ISBN: 978-3-030-45096-0

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics