Abstract
This chapter is related to the field of magnetic force microcopy (MFM), where the probing tip is covered with a magnetic layer and the magnetic domain structure of the sample can be characterized with high lateral resolution. In addition, other scanning probe methods mapping the magnetic field at a microscopic scale and techniques providing access to atomic scale magnetism are reviewed.
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Meyer, E., Bennewitz, R., Hug, H.J. (2021). Magnetic Force Microscopy. In: Scanning Probe Microscopy. Graduate Texts in Physics. Springer, Cham. https://doi.org/10.1007/978-3-030-37089-3_4
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DOI: https://doi.org/10.1007/978-3-030-37089-3_4
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Publisher Name: Springer, Cham
Print ISBN: 978-3-030-37088-6
Online ISBN: 978-3-030-37089-3
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