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Multiparametric Reference Materials for Metrological Support in the Area of Coating Parameter Control

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Reference Materials in Measurement and Technology (RMMT 2018)

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Abstract

The present work analyses the state and development prospects of metrological support and standardisation in the field of measuring surface density, thickness and chemical composition of coatings. The main characteristics of the State Primary Measurement Standard GET 168-2015 and developed multiparametric reference materials are described.

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Abbreviations

RM:

Reference material

XRF:

X-ray fluorescence

GET, GET 168-2015:

State Primary Measurement Standard for units of surface density and mass fraction of elements in coatings 168-2015

TS:

Transfer standard

References

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Author Contribution Statement

Alexander S. Vasilyev: conducted experimental studies and prepared materials for the article.

Vyacheslav V. Kazantsev: reviewed the literature, summarised the results of the study and prepared a conclusion.

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Authors and Affiliations

  1. Ural Scientific Research Institute for Metrology (UNIIM), Ekaterinburg, Russia

    Vyacheslav V. Kazantsev & Alexander S. Vasilyev

Authors
  1. Vyacheslav V. Kazantsev
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  2. Alexander S. Vasilyev
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Corresponding author

Correspondence to Vyacheslav V. Kazantsev .

Editor information

Editors and Affiliations

  1. Ural Scientific Research Institute for Metrology, Ekaterinburg, Russia

    Sergei V. Medvedevskikh

  2. Ural Scientific Research Institute for Metrology, Ekaterinburg, Russia

    Olga N. Kremleva

  3. A.P. Vinogradov Institute of Geochemistry Siberian Branch, Russian Academy of Sciences, Irkutsk, Russia

    Irina E. Vasil’eva

  4. Ural Scientific Research Institute for Metrology, Ekaterinburg, Russia

    Egor P. Sobina

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Kazantsev, V.V., Vasilyev, A.S. (2020). Multiparametric Reference Materials for Metrological Support in the Area of Coating Parameter Control. In: Medvedevskikh, S., Kremleva, O., Vasil’eva, I., Sobina, E. (eds) Reference Materials in Measurement and Technology. RMMT 2018. Springer, Cham. https://doi.org/10.1007/978-3-030-32534-3_4

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