Abstract
The Test Set for the Power-MOS Devices and RF-Circuitry, as described in Chapter [11], and the Measurements for RF-Amplifiers, Bond Wire Fusing and MOS Power Cells (see Chapter [18]) were used to validate simulation results of coupled problems by comparing with measurements, as well as by comparing to outcomes with other simulation tools (when possible, mostly without full coupling).
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Janssen, R. et al. (2019). Validation of Simulation Results on Coupled Problems. In: ter Maten, E., Brachtendorf, HG., Pulch, R., Schoenmaker, W., De Gersem, H. (eds) Nanoelectronic Coupled Problems Solutions. Mathematics in Industry(), vol 29. Springer, Cham. https://doi.org/10.1007/978-3-030-30726-4_22
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DOI: https://doi.org/10.1007/978-3-030-30726-4_22
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