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Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test

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Statistical Quality Technologies

Part of the book series: ICSA Book Series in Statistics ((ICSABSS))

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Abstract

In this chapter, constant-stress Partially Accelerated Life Tests (PALT) are considered for products with the assumption that the lifetimes of products follow Weibull distribution with known shape parameter and unknown scale parameter. Based on data obtained using Type-II censoring, the maximum likelihood estimates (MLEs) of the Weibull parameters and acceleration factor are obtained assuming linear and Arrhenius relationships with the lifetime characteristics and stress. Exact distributions of the MLEs of the parameters of Weibull distribution are also obtained. Optimal acceptance sampling plans are developed using both linear and Arrhenius relationships. Some numerical results are also presented to illustrate the resulted test plans.

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Acknowledgements

The author would like to express his gratitude to the editor for his constructive comments which improved the presentation of the chapter. The author would also like to thank Mr. Bajeel P N for his computational assistance.

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Authors and Affiliations

  1. Department of Mathematics, National Institute of Technology Calicut, Kozhikode, Kerala, India

    M. Kumar

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  1. M. Kumar
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Correspondence to M. Kumar .

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Editors and Affiliations

  1. Department of Mathematical Sciences, University of South Dakota, Vermillion, SD, USA

    Yuhlong Lio

  2. Department of Statistical Science, Southern Methodist University, Dallas, TX, USA

    Hon Keung Tony Ng

  3. Department of Statistics, Tamkang University, New Taipei, Taiwan

    Tzong-Ru Tsai

  4. Department of Statistics, University of Pretoria, Pretoria, South Africa

    Ding-Geng Chen

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Kumar, M. (2019). Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test. In: Lio, Y., Ng, H., Tsai, TR., Chen, DG. (eds) Statistical Quality Technologies. ICSA Book Series in Statistics. Springer, Cham. https://doi.org/10.1007/978-3-030-20709-0_10

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