Abstract
This chapter presents scanning probe microscopy and the most important microscopes using this technique. Historically the first of these devices, the scanning tunneling microscope (STM) is used for atomic-scale imaging of the surface of samples of conducting materials. The STM is an inestimable instrument for research in solid state physics, quantum chemistry and molecular biology. Its operation is based on the conversion of the distance between its tip and the studied surface into electric current. Another question is the control of the position of the scanning tip and the recording of data for generating a map of the studied surface. The experience acquired in the construction of the STM was of much use in the development of other types of scanning microscopes. In this chapter we discuss also the atomic force microscope (AFM), electrostatic force microscope (EFM), scanning thermal microscope (SThM) and scanning near-field optical microscope (SNOM). We also present a wide range of current and prospective applications of scanning microscopes.
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Nawrocki, W. (2019). Scanning Probe Microscopes. In: Introduction to Quantum Metrology. Springer, Cham. https://doi.org/10.1007/978-3-030-19677-6_12
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DOI: https://doi.org/10.1007/978-3-030-19677-6_12
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