Abstract
The previous chapter focused on detecting changes in crystallographic alignment by analysing the relative separation of the main Dirac point (mDP) and secondary Dirac point (sDP) in transport data. Two key limiting factors are addressed here: (1) The device architecture was complex requiring a large number of fabrication steps that resulted in a number of devices not surviving the fabrication process. (2) Results were obtained from large \({\sim }\,\upmu \mathrm{m}\) scale areas that would potentially smear out evidence of flake/kink motion and changes in relative crystal alignment.
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Holwill, M. (2019). Atomic Force Microscopy Studies of Superlattice Kinks. In: Nanomechanics in van der Waals Heterostructures. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-030-18529-9_6
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DOI: https://doi.org/10.1007/978-3-030-18529-9_6
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