Abstract
The ideal AFM tip is (from the point of view of surface imaging) a sharp needle which can image even surface features with high aspect ratio. If the tip has a broader shape, artifacts occur due to a convolution of the tip shape with the surface features. Nearby micro tips can lead to a doubling of surface features in the acquired AFM image. Other kinds of artifacts in atomic force microscopy (Klapetek, Quantitative data processing in scanning probe microscopy, 2nd edn. Elsevier, Amsterdam, 2018, [1]; Golek, Mazur, Ryszka, Zuber, Appl Surf Sci 304, 11–19, 2014, [2]; Eaton, Batziou, Atomic force microscopy, vol. 1886. Humana Press, New York, 2019, [3]) include thermal drift, feedback overshoot, piezo creep, and electrical noise.
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Voigtländer, B. (2019). Artifacts in AFM. In: Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-13654-3_8
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DOI: https://doi.org/10.1007/978-3-030-13654-3_8
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