Abstract
In order to perform nanoscale motions in AFM (e.g. during scanning) very precise actuators are required. Piezoelectric actuators achieve the required precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
In tables sometimes also the elastic compliance S is used, which corresponds to the reciprocal of Young’s modulus.
- 2.
In this simplified consideration, we have left out the formation energy of domain walls which results in the formation of larger domains. Larger domains mean less domain wall energy. A further contribution in the energy balance is the build up of mechanical strain inside the domains when an external electric field is applied.
- 3.
Note that accelerometers often measure the root mean square (RMS) amplitude which is smaller than the peak amplitude by a factor of \(1/\sqrt{2}\).
References
W. Heywang, K. Lubitz, W. Wersing (eds.), Piezoelectricity, 1st edn. (Springer, Heidelberg, 2008). https://doi.org/10.1007/978-3-540-68683-5
PI Ceramic GmbH, Lindenstrasse, 07589 Lederhose, Germany. http://www.piceramic.com
K.G. Vandervoort, R.K. Zasadzinski, G.G. Galicia, G.W. Crabtree, Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopes. Rev. Sci. Instrum. 64, 896 (1994). https://doi.org/10.1063/1.1144139
C. Wei, A circular arc bending model of piezoelectric tube scanners. Rev. Sci. Instrum. 67, 2286 (1998). https://doi.org/10.1063/1.1146934
M. Hannss, W. Naumann, R. Anton, Performance of a tiltcompensating tube scanner in atomic force microscopy. Scanning 20, 501 (1998). https://doi.org/10.1002/sca.1998.4950200703
W.D. Pilkey, Formulas for Stress, Strain and Structural Matrices, 2nd edn. (Wiley, New York, 2005). https://doi.org/10.1002/9780470172681
aixACCT Systems GmbH, Talbotstr. 25, 52068 Aachen, Germany. www.aixacct.com
P. Eaton, P. West, Atomic Force Microscopy (Oxford Universiy Press, New York, 2010)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2019 Springer Nature Switzerland AG
About this chapter
Cite this chapter
Voigtländer, B. (2019). Technical Aspects of Atomic Force Microscopy. In: Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-13654-3_3
Download citation
DOI: https://doi.org/10.1007/978-3-030-13654-3_3
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-13653-6
Online ISBN: 978-3-030-13654-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)