Abstract
As an alternative to the most frequently used silicon cantilevers, quartz oscillators can be used as sensors in AFM. It is possible to obtain atomic resolution in FM atomic force microscopy using quartz sensors. These quartz sensors are characterized by a large spring constant (>1,000 N/m). Both quartz tuning forks, which are used in wristwatches, as well as quartz needle oscillators can be used as sensors in AFM. An advantage of using quartz sensors is that the detection of the oscillation signal can be performed completely electrically, without any optical elements, like a laser diode, a lens, a fiber, or a photodiode being needed. This simplifies the experimental setup.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
S. Morita, F.J. Giessibl, R. Wiesendanger (eds.), Non-contact Atomic Force Microscopy, vol. 2 (Springer, Heidelberg, 2009). https://doi.org/10.1007/978-3-642-01495-6
I. Morawski, B. Voigtländer, Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling current. Rev. Sci. Instrum. 81, 033703 (2010). https://doi.org/10.1063/1.3321437
F.J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa, Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Phys. Rev. B 84, 125409 (2011). https://doi.org/10.1103/PhysRevB.84.125409
G.H. Simon, M. Heyde, H.-P. Rust, Recipes for cantilever parameter determination in dynamic force spectroscopy: spring constant and amplitude. Nanotechnology 18, 255503 (2007). https://doi.org/10.1088/0957-4484/18/25/255503
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2019 Springer Nature Switzerland AG
About this chapter
Cite this chapter
Voigtländer, B. (2019). Quartz Sensors in Atomic Force Microscopy. In: Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-13654-3_18
Download citation
DOI: https://doi.org/10.1007/978-3-030-13654-3_18
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-13653-6
Online ISBN: 978-3-030-13654-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)