Abstract
The results of the X-ray diffuse scattering (DS) measurements of the Zr-rich PbZrO\(_{3}\) - PbTiO\(_{3}\) solid solution PbZr\(_{0.985}\)Ti\(_{0.015}\)O\(_3\) (PZT1.5) are presented. Measurements were performed in zero electric field and in applied electric field E = 5 kV / cm. In the antiferroelectric phase diffuse scattering streaks around \(\varSigma \) superstructure peaks \((h+\frac{1}{4}~k+\frac{1}{4}~l)\) were found and interpreted as a scattering on ferroelectric antiphase domain walls. This conclusion is corroborated by the observation of a strong influence of the electric field on these streaks. Reported results are important for the prospective application of the antiferroelectrics as the basis for the high-density non-volatile memory devices.
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Acknowledgement
We acknowledge N.G. Leontiev (AzovBlack Sea Engineering Institute, Don State Agrarian University) and I.N. Leontiev (Southern Federal University) for providing the single crystal of PZT. A.V. Filimonov and N.V. Ravi Kumar acknowledge the support of Russian Foundation for Basic Research (Grant No. 16-52-48016). S. Udovenko acknowledges the support of the Ministry of Science and Education of the Russian Federation, project no. 3.1150.2017/4.6. D. Andronikova acknowledges the support of Russian Foundation for Basic Research (Grant No. 16-29-14018) and the Russian President Scholarship No. SP-3762.2018.5
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Vakhrushev, S., Andronikova, D.A., Chernyshov, D.Y., Filimonov, A.V., Udovenko, S.A., Kumar, N.V.R. (2018). X-Ray Scattering by Antiphase Ferroelectric Domain Walls in the Antiferroelectric Phase of the PbZr\(_{0.985}\)Ti\(_{0.015}\)O\(_3\). In: Galinina, O., Andreev, S., Balandin, S., Koucheryavy, Y. (eds) Internet of Things, Smart Spaces, and Next Generation Networks and Systems. NEW2AN ruSMART 2018 2018. Lecture Notes in Computer Science(), vol 11118. Springer, Cham. https://doi.org/10.1007/978-3-030-01168-0_63
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