Abstract
We address the rationale for surface profile filtering and trace the evolution of filtering techniques from the early 2RC filter to recently introduced filters such as the Gaussian regression, spline, morphological and wavelet-based filters. We briefly mention some advantages and limitations of the different methods. Several excellent references that pertain to filtering are cited in this chapter.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
American Society of Mechanical Engineers 2002, ASME B46.1-2002, Surface Texture (Surface Roughness, Waviness and Lay), ASME. New York, NY, USA.
International Organization for Standardization 1996, ISO 11562:1996, Geometrical Product Specification (GPS) – Surface Texture: Profile Method – Metrological Characteristics of Phase Correct Filters, ISO. Geneva, Switzerland.
Malburg, M.C. 1996, AÂ Unified Methodology for the Application of Surface Metrology, Ph.D. Dissertation, University of Warwick. Coventry, UK.
Muralikrishnan, B. 2003, Process Diagnostics and Functional Correlation in Surface Metrology, Ph.D. Dissertation, University of North Carolina at Charlotte. Charlotte NC, USA.
Raja, J., Muralikrishnan. B. and Fu. S. 2002, ‘Recent advances in separation of roughness, waviness and form’, Precision Engineering, vol. 26, no. 2, pp. 222–235.
Raja, J. and Radhakrishnan, V. 1977, ‘Analysis and synthesis of surface profiles using Fourier series’, International Journal of Machine Tool Design and Research, vol. 17, pp. 245–251.
Raja, J. and Radhakrishnan, V. 1979a, ‘Filtering of surface profiles using fast Fourier transform’, International Journal of Machine Tool Design and Research, vol. 19, pp. 133–141.
Raja, J. and Radhakrishnan, V. 1979b, ‘Digital filtering of surface profiles’, Wear, vol. 57,pp. 147–155.
Von Weingraber, H. 1956, ‘Zur Definition der Oberflächenrauheit Werkstattstechnik’, Masch. Bau, vol. 46.
Von Weingraber, H. 1957, ‘Über die Eignung des Hullprofils als Bezugslinie für Messung der Rauheit’, Microtechnic, vol. 11, pp. 6–17.
Vorburger, T.V. and Raja, J. 1990, Surface Finish Metrology Tutorial, NISTIR 89-4088, National Institute of Standards and Technology. Gaithersburg, MD.
Whitehouse, D.J. 1967, ‘Improved type of wavefilter for use in surface-finish measurement’, Proceedings of the Institution of Mechanical Engineers, vol. 182, no. 3K, pp. 306–318.
Whitehouse, D.J. 1994, Handbook of Surface Metrology, Institute of Physics Publishing. Bristol, UK, Philadelphia, USA.
Whitehouse, D.J. and Reason, R.E. 1965, The Equation of the Mean Line of Surface Texture Found by an Electric Wave Filter, Rank Taylor Hobson. Leicester, UK.
Rights and permissions
Copyright information
© 2009 Springer London
About this chapter
Cite this chapter
(2009). A Brief History of Filtering. In: Computational Surface and Roundness Metrology. Springer, London. https://doi.org/10.1007/978-1-84800-297-5_2
Download citation
DOI: https://doi.org/10.1007/978-1-84800-297-5_2
Publisher Name: Springer, London
Print ISBN: 978-1-84800-296-8
Online ISBN: 978-1-84800-297-5
eBook Packages: EngineeringEngineering (R0)