Abstract
This chapter presents an overview of reliability demonstration methods applied in the industry for product validation programs. Main emphasis is made on success run testing and test to failure approaches. It also presents a discussion on the underlying assumptions, complexities, and limitations of the reliability demonstration methods.
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References
GMW3172, General specification for electrical/electronic component analytical/development/validation (A/D/V) Procedures for Conformance to Vehicle Environmental, Reliability, and Performance Requirements, General Motors Worldwide Engineering Standard, 2005. http://www.standardsstore.ca
Lewis M. Designing reliability-durability testing for automotive electronics — A commonsense approach. TEST Engineering and Management 2000; August/September: 14–16.
ReliaSoft Corporation. Lambda predict users guide. ReliaSoft Corporation, Tucson, AZ, 2004, http://www.reliasoft.com
O’Connor P. Practical reliability engineering. 4th edition, Wiley, New York, 2003.
Abernethy R. The new Weibull handbook. 4th edition by Dr. Robert Abernethy, ISBN 0-9653062-1-6, 2000.
ReliaSoft Corporation. Weibull++ user guide. ReliaSoft Corporation, Tucson, AZ, 2002. http://www.reliasoft.com
Kececioglu D, Reliability engineering handbook. Prentice Hall, Englewood Cliffs, NJ, 2002.
Kleyner A, Sandborn P, Boyle J. Minimization of life cycle costs through optimization of the validation program — A test sample size and warranty cost approach. Proceedings of Annual Reliability and Maintainability Symposium, Los Angeles., CA, 2004; 553–557.
Lipson C, Sheth N. Statistical design and analysis of engineering experiments. McGraw-Hill, New York, 1973.
Kleyner A, Boyle J. Demonstrating product reliability: Theory and application. Tutorial Notes of Annual Reliability and Maintainability Symposium, Alexandria, VA, Jan. 2005; (Section 12).
Martz H, Waller R. Bayesian reliability analysis. Wiley, New York, 1982.
Kleyner A, Bhagath S, Gasparini M, Robinson J, Bender M. Bayesian techniques to reduce the sample size in automotive electronics attribute testing. Microelectronics and Reliability 1997; 37(6):879–883.
Krolo A, Bertsche B. An approach for the advanced planning of a reliability demonstration test based on a Bayes procedure. Proc. RAMS-Conference, Tampa, FL; Jan. 2003:288–294.
Hobbs G. Accelerated reliability engineering: HALT and HASS. Wiley, New York, 2000.
Kleyner A, Boyle J. The myths of reliability demonstration testing. TEST Engineering and Management 2004; August/September: 16–17.
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© 2008 Springer-Verlag London Limited
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Kleyner, A. (2008). Reliability Demonstration in Product Validation Testing. In: Misra, K.B. (eds) Handbook of Performability Engineering. Springer, London. https://doi.org/10.1007/978-1-84800-131-2_34
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DOI: https://doi.org/10.1007/978-1-84800-131-2_34
Publisher Name: Springer, London
Print ISBN: 978-1-84800-130-5
Online ISBN: 978-1-84800-131-2
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