Abstract
The electron is a negatively charged subatomic particle with elemental charge e = 1.60218 × 10−19 C and mass m e = 9.10938 × 10−31 kg. The electron was discovered by British physicist J.J. Thomson in 1897. At the Cavendish Laboratory, Cambridge University, J.J. Thomson was experimenting with a cathode ray tube (CRT), investigating a long-standing puzzle known as “cathode rays.”
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
Botton G (ed) (2007) Analytical electron microscopy. Science of microscopy, Springer, New York
Busch H (1927) On the operation of the concentration coil in a Braun tube. Arch Electrotech 18:583
Cowley JM (1993) Configured detectors for STEM imaging of thin specimens. Ultramicroscopy 49:4–13
Egerton RF (2011) Electron energy-loss spectroscopy in the electron microscope, 2nd edn. Springer, New York
Goodman P (ed) (1981) Fifty years of electron diffraction. D. Reidel. Dordrecht, Holland, IUCr
Ichimiya A, Cohen PI (2004) Reflection high energy electron diffraction. Cambridge University Press
Kim T, Kim S, Olson E, Zuo JM (2008) In situ measurements and transmission electron microscopy of carbon nanotube field-effect transistors. Ultramicroscopy 108:613–618
Knoll M, Ruska E (1932) Das elektronenmikroskop. Zeitschrift Fur Physik 78:318–339
LaGrange T, Campbell GH, Reed B, Taheri M, Pesavento JB, Kim JS, Browning ND (2008) Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM). Ultramicroscopy 108:1441–1449
MacGillavry CH (1940) Examination of the dynamic theory of electron diffraction on lattice. Physica 7:329–343
McCartney MR, Gajdardziskajosifovska M (1994) Absolute measurement of normalized thickness, t/λi, from off-axis electron holography. Ultramicroscopy 53:283–289
Mollenstedt G (1989) My early work on convergent-beam electron-diffraction. Phys Status Solidi A 116:13–22
Pennycook S, Nellist P (eds) (2011) Scanning transmission electron microscopy, imaging and analysis. Springer, New York
Reimer L, Kohl H (2008) Transmission electron microscopy (4th). Springer, Berlin
Riecke WD, Ruska E (1966) A 100 kV transmission electron microscope with single-field condenser objective. VI. Int. Congress for Electron Microscopy, Kyoto, Japan
Ruska E (1987) The development of the electron-microscope and of electron-microscopy. Rev Mod Phys 59:627–638
Sanchez SI, Small MW, Sivaramakrishnan S, Wen JG, Zuo JM, Nuzzo RG (2010) Visualizing materials chemistry at atomic resolution. Anal Chem 82:2599
Thomson GP, Reid A (1927) Diffraction of cathode rays by a thin film. Nature 119:890
Tonomura A, Matsuda T, Endo J, Todokoro H, Komoda T (1979) Development of a field-emission electron-microscope. J Electron Microsc 28:1–11
von Ardenne M (1940) About a universal electron microscope for brightfield, darkfield and stereo operation. Z Physik 115:339–368
von Ardenne, M. (1985). On the history of scanning electron-microscopy, of the electron-microprobe, and of early contributions to transmission electron-microscopy. In: Hawkes PW (ed) The beginnings of electron microscopy, Elsevier
Warren BE (1990) X-ray diffraction, Reprint edn. Dover Publications
Williams DB, Carter BC (2009) Transmission electron microscopy, a textbook for materials science (2nd Editiom). Springer, New York
Zewail AH (2006) 4d ultrafast electron diffraction, crystallography, and microscopy. Annu Rev Phys Chem 57:65–103
Zuo JM (1992) Automated lattice-parameter measurement from HOLZ lines and their use for the measurement of oxygen-content in YBa2Cu3O7-Δ from nanometer-sized region. Ultramicroscopy 41:211–223
Author information
Authors and Affiliations
Corresponding authors
Rights and permissions
Copyright information
© 2017 Springer Science+Business Media New York
About this chapter
Cite this chapter
Zuo, J.M., Spence, J.C.H. (2017). Introduction and Historical Background. In: Advanced Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6607-3_1
Download citation
DOI: https://doi.org/10.1007/978-1-4939-6607-3_1
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4939-6605-9
Online ISBN: 978-1-4939-6607-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)