Performance Bound Analysis of Analog Circuits Considering Process Variations

  • Guoyong Shi
  • Sheldon X.-D. Tan
  • Esteban Tlelo Cuautle
Chapter

Abstract

It is well accepted that variations have huge impacts on circuit performance, yield, and reliability in the nanometer regime. Analog and mixed-signal circuits are especially sensitive to process variations as a lot of matching and regularities are required.

Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • Guoyong Shi
    • 1
  • Sheldon X.-D. Tan
    • 2
  • Esteban Tlelo Cuautle
    • 3
  1. 1.School of MicroelectronicsShanghai Jiao Tong UniversityShanghaiChina
  2. 2.Department of Electrical EngineeringUniversity of CaliforniaRiversideUSA
  3. 3.INAOETonantzintlaMexico

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