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Other Surface Imaging Methods with Electrons

  • Ernst Bauer
Chapter

Abstract

There are many other surface imaging methods, which are competing or complementary to cathode lens microscopy with slow electrons. Scanning probe microscopy in various imaging modes extends the resolution down to the atomic level and is frequently combined with the imaging methods discussed in this book. Here we make only a short comparison with imaging methods using reflected or emitted electrons, independent of energy and experimental setup.

Keywords

Diffract Beam Reflection High Energy Electron Diffraction Reflection High Energy Electron Diffraction Pattern Indium Zinc Oxide Secondary Electron Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • Ernst Bauer
    • 1
  1. 1.Department of PhysicsArizona State UniversityTempeUSA

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