Abstract
Accurate relative X-ray intensity measurements were made on ZnSe. Comparison of the results with the values calculated from the theoretical atomic scattering reveals systematic discrepancies. The discrepancies are different for the three families of reflections allowed by the structure, and they occur for all observable peaks. An explanation is suggested based on electron transfer.
This work was sponsored by the U. S. Air Force.
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Raccah, P.M. (1969). Meaning of an Anomaly in the X-Ray Scattering of ZnSe. In: Haidemenakis, E.D. (eds) Electronic Structures in Solids. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-6537-0_6
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DOI: https://doi.org/10.1007/978-1-4899-6537-0_6
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