X-Ray Crystallography I: The Methods of Observing the X-Ray Diffraction Patterns of Crystals
The diffraction of X-rays by crystals, which is the basis of X-ray crystallography, probably accounts for the largest number of applications of X-rays. The field of these applications is very wide, ranging from the actual determination of the structure of crystals to chemical analysis and including such things as the determination of stress and of particle or crystal size, investigations of phase equilibria and crystal orientation.
KeywordsLattice Plane Bragg Angle Reciprocal Lattice Diffract Beam Layer Line
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- 1.See for example. for single crystal methods: (a) McLachlan, X-ray Crystal Structure, McGraw Hill (1957). (b) Henry, Lipson & Wooster, The Interpretation of X-ray Diffraction Photographs, Macmillan (1961). (c) Buerger, X-Ray Crystallography, Wiley (1942). for methods for polycrystalline materials: (d) Peiser, Rooksby & Wilson (ed.); X-ray Diffraction by Polycrystalline Materials, Institute of Physics (1960). (e) Klug & Alexander, X-ray Diffraction Procedures for Polycrystalline Materials, Wiley (1954). (f) Cullity, Elements of X-ray Diffraction, Addison-Wesley (1956). (g) Azaroff & Buerger, The Powder Method in X-ray Crystallography, McGraw Hill, (1958).Google Scholar
- 2.(a) Buerger, The Photography of the Reciprocal Lattice. Monograph No. 1 of the American Society for X-ray and Electron Diffraction. (b) Buerger, The Precession Method, Wiley (1964).Google Scholar
- 3.Cullity, Elements of X-ray Diffraction, 164–165, Addison-Wesley (1956).Google Scholar
- 4.(a) Guinier, X-Ray Crystallographic Technology. (Translated from Radio-crystallographie), Hilger and Watts (1952). (b) Guinier & Dexter, X-Ray Studies of Materials, Interscience Publishers (1963)Google Scholar