Experiences of an On-Line Fourier Transform Faradaic Admittance Measurement (FT-FAM) System Based on Digital Signal Processors
The theory and practical implementation of the Fourier Transform Faradaic Admittance Measurement technique was introduced and developed by Smith and coworkers.1,2 This electroanalytical technique now rests on a sound theoretical basis and has been proven in many experimental situations. In this method a multiple-frequency perturbation waveform is used and the cell admittance is calculated at each of these frequencies using the measured current and potential. Measurements over a substantial range of frequencies, at least over two orders of magnitude, are required before any conclusive interpretations can be made concerning the mechanism and kinetics of an electrochemical system. The main advantage of this Fourier transform approach is that the cell admittance can simultaneously by measured at a large number of frequencies.
KeywordsDouble Layer Capacitance Digital Signal Processor Excitation Signal Sound Theoretical Basis Charge Transfer Kinetic
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