Advertisement

Universal Conductance Fluctuations in Narrow Channel Mosfets

  • Jacob Caro
  • Jianrong Gao
  • Adrianus H. Verbruggen
  • Sybrand Radelaar
  • Jan Middelhoek
Chapter
Part of the NATO ASI Series book series (NSSB, volume 254)

Abstract

Mesoscopic normal-metal wires and rings exhibit random, reproducible fluctuations in the magnetoconductance (MC) G(B) due to quantum interference of electron waves [1,2]. These fluctuations are called universal conductance fluctuations (UCF) because at zero temperature their magnitude is of order of e 2/h, regardless of the degree of disorder and the sample size. The fluctuation pattern is sensitive to the microscopic distribution of elastic scatterers for electrons and therefore the fluctuation traces are sometimes referred to as magneto-fingerprints. At finite temperature the size of the sample usually exceeds the inelastic diffusion length L in of the electrons, and due to classical self-averaging the magnitude of the fluctuations is reduced.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    Several authors in IBM J. Res. Develop. 32 (3) (1988), and references thereinGoogle Scholar
  2. [2]
    P.A. Lee and A.D. Stone, Phys. Rev. Lett. 55, 1622 (1985);ADSCrossRefGoogle Scholar
  3. [2a]
    P.A. Lee, A.D. Stone, and H. Fukuyama, Phys. Rev. B 35, 1039 (1987)ADSCrossRefGoogle Scholar
  4. [3]
    J.R. Gao, J. Caro, A.H. Verbruggen, S. Radelaar, and J. Middelhoek, Phys. Rev. B 40, 11676 (1989)CrossRefGoogle Scholar
  5. [4]
    A.H. Verbruggen, B.M.G. de Lange, B.A.C. Rousseeuw, H.A.H. Billiet, and S. Radelaar, Microelectronic Engineering 11, 561 (1990)CrossRefGoogle Scholar
  6. [5]
    J.R. Gao, J. Caro, A.H. Verbruggen, S. Radelaar, and J. Middelhoek, Microelectronic Engineering 9, 373 (1989)CrossRefGoogle Scholar
  7. [6]
    B.L. Al’tshuler and A.G. Aronov, JETP Lett. 33, 499 (1981)ADSGoogle Scholar
  8. [7]
    D.J. Bishop, R.C. Dynes, and D.C. Tsui, Phys. Rev. B 26, 773 (1982)ADSCrossRefGoogle Scholar
  9. [8]
    W.J. Skocpol, L.D. Jackel, E.L. Hu, R.E. Howard, and L.A. Fetter, Phys. Rev. Lett. 49, 951 (1982)ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1991

Authors and Affiliations

  • Jacob Caro
    • 1
  • Jianrong Gao
    • 1
  • Adrianus H. Verbruggen
    • 1
  • Sybrand Radelaar
    • 1
  • Jan Middelhoek
    • 2
  1. 1.Delft Institute for Microelectronics and Submicron TechnologyDelft University of TechnologyDelftThe Netherlands
  2. 2.Vakgroep IC-Technology and ElectronicsTwente University EnschedeThe Netherlands

Personalised recommendations