Overpressurized Inert Gas Clusters in Al and Si Observed by EXAFS Spectroscopy
I present some recent experimental investigation on inert gas clusters, obtained by ion implantation of Al and Si. The use of the Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy has provided information on the structural and thermodynamical behaviour of the clusters: at room temperature, overpressurized crystalline Ar clusters are detected in the as-implanted samples, while Xe agglomerates are in the solid phase only after annealing. In both samples the evaluation of the Debye-Waller factor has provided an independent determination of the Debye temperature which has been found to be in excellent agreement with the value deduced from the overpressure using the nearest-neighbour distance.
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