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Electron Probe Quantitation pp 145–161Cite as

Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen)

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Abstract

Due to the rapid development and expansion of materials science into new areas such as high-temperature materials, wear-resistant coatings and modern ceramics the interest in quantitative electron probe microanalysis of ultra-light elements, e.g., boron, carbon, nitrogen and oxygen, elements which are usually present in considerable quantities in such materials, is also rapidly growing. In comparison with the conventional analysis of medium-to-high Z-elements (Z > 11) the requirements for the successful analysis of ultra-light elements are much more stringent for all the steps involved in the complete procedure, which begins with the specimen preparation, followed by the actual intensity measurement and ending with the matrix correction.

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References

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Author information

Authors and Affiliations

  1. Laboratory for Physical Chemistry-Center for Technical Ceramics, University of Technology, P.O. Box 513, NL-5600 MB, Eindhoven, The Netherlands

    G. F. Bastin & H. J. M. Heijligers

Authors
  1. G. F. Bastin
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  2. H. J. M. Heijligers
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Editor information

Editors and Affiliations

  1. Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    K. F. J. Heinrich  & Dale E. Newbury  & 

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© 1991 Springer Science+Business Media New York

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Bastin, G.F., Heijligers, H.J.M. (1991). Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen). In: Heinrich, K.F.J., Newbury, D.E. (eds) Electron Probe Quantitation. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2617-3_8

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  • DOI: https://doi.org/10.1007/978-1-4899-2617-3_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-2619-7

  • Online ISBN: 978-1-4899-2617-3

  • eBook Packages: Springer Book Archive

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