A self Contained Inductance Bridge for Rapid NDT of Superconducting Thin Films
We describe a compact, self contained inductance bridge for rapid testing of superconductive thin films. The bridge requires no adjustments, has a high sensitivity and small offset and can be used for both routine screening of thin films and for basic studies of high temperature superconductors, HTSC, such as the proximity effect.
KeywordsCritical Current Density Thin Film Sample Superconducting Thin Film Physica Status Solidus Screen Current
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