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A self Contained Inductance Bridge for Rapid NDT of Superconducting Thin Films

  • Emil Polturak
  • Daniel Cohen
  • David Cohen
  • Gad Koren

Abstract

We describe a compact, self contained inductance bridge for rapid testing of superconductive thin films. The bridge requires no adjustments, has a high sensitivity and small offset and can be used for both routine screening of thin films and for basic studies of high temperature superconductors, HTSC, such as the proximity effect.

Keywords

Critical Current Density Thin Film Sample Superconducting Thin Film Physica Status Solidus Screen Current 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1991

Authors and Affiliations

  • Emil Polturak
    • 1
  • Daniel Cohen
    • 1
  • David Cohen
    • 1
  • Gad Koren
    • 1
  1. 1.Crown Center for Superconductivity, Physics DepartmentTechnion-Israel Institute of TechnologyHaifaIsrael

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